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Latest Test and Measurement NewsRigol introduced economic 4 Channel Digital Oscilloscope09 October 2013 - Rigol Technologies introduced the DS1000Z Series digital oscilloscope, the latest addition to the Rigol scope family, featuring their UltraVision technology. The new DS1000Z is available in 70 or 100 MHz bandwidths and provides the performance expected from a modern 4 channel oscilloscope, but at the cost of a traditional 2 channel scope. Advantest to showcase Cloud Testing Platform at SEMICON Europa 201308 October 2013 - Advantest Corporation will showcase its suite of semiconductor solutions, ranging from nanotechnology electron beam (EB) lithography to automatic test equipment and cloud testing services at the SEMICON Europa 2013 trade show, stand #1.207, Hall 1, October 8-10 in Dresden, Germany. Power Analysis Options and Wideband Probe for Rohde & Schwarz Oscilloscopes08 October 2013 - Rohde & Schwarz has added power analysis options and a new differential wideband probe to its portfolio of analysis solutions for clocked power supplies. Developers can use the R&S RTO-K31 or R&S RTM-K31 option to automatically perform all major quality analyses and conveniently document the measurement results. The new R&S RT ZD10 probe is especially ideal for the characterization of switching power supplies with high clock frequencies. Handheld Instrument with Pulse Measurements simplifies Radar Field Testing07 October 2013 – Agilent Technologies introduced a pulse measurement option for its FieldFox handheld analyzers that is designed to further simplify radar field testing. With the new pulse-measurement option, Agilent’s FieldFox analyzers allow users to carry a single instrument into the field to verify and measure radar pulse characteristics, S-parameters, spectrum analysis and transmitter power. aps Solutions appoints Director of Sales and Marketing04 October 2013 - aps Solutions GmbH announced the assignment of Paul O’Neil as a Director of Sales & Marketing. This move will empower APS’ sales and marketing skills for the upcoming years with their extended portfolio of high technology Semiconductor and LED testing products, like probe cards, test sockets, analytical probers and test production probers/sorters for the LED industry. New 100/400G Optical Networking Test Solutions02 October 2013 - Tektronix expanded the testing support for both short range and long haul 100G optical network testing with the 80C15 32GHz Multi-Mode Optical Sampling Module and the OM5110 46GBaud Multi-format Optical Transmitter. These instruments are giving customers enhanced capability to test silicon photonic components, network elements and systems as well as the coherent modulation formats used in next generation optical fiber networks. Smartphone and Defense Simulations accelerated by a Factor of 6401 October 2013 – Agilent Technologies announced that SystemVue, its premier platform for communications and aerospace/defense systems design, supports high-performance distributed computing. System architects of wireless, 4G smartphone and radar applications can now verify next-generation system performance up to 64 times faster using Linux-based grid computing managers such as the IBM Platform Load Sharing Facility. More Articles ...
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