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Latest Test and Measurement NewsBoundary Scan Support throughout the entire Product Life Cycle25 March 2011 - GOEPEL electronic introduces the support of multi protocol interface chips from the British company Future Technology Devices International (FTDI) for their utilisation as native Boundary Scan controllers. The single-chip solutions with USB2.0 control will be used in the recently developed PicoTAP Boundary Scan controllers. Additionally, they can be included in customer designs to implement onboard system-level JTAG applications. Aeroflex extends Capability of PXI 3000 Series with LTE TDD Measurement Suite24 March 2011— Aeroflex announced the launch of a new software measurement suite for its PXI 3000 Series of modular instruments, to support the Time Division Duplex (TDD) mode of 3GPP Long Term Evolution (LTE) – also known as TD-LTE. The LTE TDD Measurement Suite provides LTE TDD chipset, handset and terminal device manufacturers with the advanced test capability they need to rapidly characterize device performance. Viscom and CyberOptics Announce Cooperation for 3D Solder Paste Inspection24 March 2011 - Viscom AG, Hannover, Germany, and CyberOptics Inc., Minneapolis, MN, USA, jointly announce an OEM agreement to equip Viscom's SPI inspection systems product line with CyberOptics' 3D SPI sensor technology. The development and supply agreement allows for the integration of CyberOptics SE500 sensor technology into the Viscom PCB inspection platforms. Viscom's S3088 SPI with the CyberOptics SE500 sensor will be shown at the upcoming SMT show in Nuremberg. XJTAG now available with a free Layout Viewer23 March 2011 — XJTAG announced the release of its Boundary Scan Software XJTAG version 2.5, which now includes a free layout viewer. The XJTAG Layout Viewer has been designed to improve productivity by allowing engineers to quickly visualise the exact location of faults. Line Impedance Stabilization Network23 March 2011 - Teseq introduces a new Line Impedance Stabilization Network (LISN) for conducted emissions testing of Grid Connected Power Conditioners (GCPC). The DC-LISN-M2-25-V1 is designed for measuring unsymmetrical disturbances on DC power ports in the frequency range from 150 kHz to 30 MHz. Measuring Tool for Solar Cell Production22 March 2011 – GP Solar GmbH presents its newest product advancement in laboratory measuring technology, the GP ISO-TEST .Waf. This is an essential measuring tool for achieving the highest cell efficiencies. The unit tests isolation resistance between the front and back sides of diffused wafers following chemical edge isolation. Digital Radio Frequency V4 Test Solution21 March 2011 – Agilent Technologies announced the industry’s first digital radio frequency (DigRF) V4 test solution with dual-capture capability. This software enhancement gives engineers the ability to simultaneously apply a stimulus to devices under test and analyse the results with a single instrument, the Agilent N5343A DigRF V4 exerciser. More Articles ...
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