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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsNew CMOS Image Sensor Test Solution with 64-DUT Parallelism10 November 2010 - Advantest Corporation announced a new CMOS image sensor test solution for its flagship SoC test system, the T2000, which will be available from November. The new solution enables highly accurate and massively parallel testing for CMOS image sensor devices to help customers lower their test cost. New system combines the benefits of in-circuit and boundary-scan test09 November 2010 - Digitaltest and JTAG Technologies announced the integration of their test methods within the Digitaltest MTS series of in-circuit test systems. As a result, electronics designers and manufacturers will benefit from even greater test coverage and programmability of complex PCBs, all within a single process step. Agilent Technologies introduces new Handheld Digital Multimeters08 November 2010 - Agilent Technologies Inc. announced the U1270 Series handheld digital multimeters (DMMs), setting new levels of performance in industrial handheld DMMs. This series offers a wide range of measurement capabilities; including feature sets that are found only in higher end industrial handheld DMMs. Seica presents renewed Flying prober and new compact test systems05 November 2010 - Seica presents on electronica in Hall A1, Booth 459 the renewed Flying probe platform Pilot and the new generation of in-circuit and functional test systems of the Compact Line. Test Automation Framework for the entire testing cycle04 November 2010 - QualiSystems announced the release of TestShell 4.3, the latest and most advanced version of its test automation framework for systems, network equipment and electronic devices. The end-to-end test automation framework covers the entire testing cycle, helping enterprises across the value chain boost product quality, shorten time to market and reduce test operations costs and organizational capital. Test Solution for High-Speed Interface Devices03 November 2010 - Advantest Corporation announced the availability of its new high-speed interface test solution for its flagship SoC test system, the T2000. The new solution is capable of measurement at speeds up to 12.5Gbps and is enabled by the N6010A Serial Port Parametric Test Module manufactured by Agilent Technologies. Optical spectrum analyser offers exceptional accuracy and resolution03 November 2010 - Yokogawa's new optical spectrum analyser AQ6370C combines exceptional accuracy and resolution with ultra-high dynamic range, comprehensive interfacing and ease of use. The new AQ6370C is therefore an ideal solution for applications including R&D and production testing of optical devices and transmission systems. More Articles ...
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