|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System Test
Tool for automated Module Integration Testing of embedded Software26 February 2014 - The new version 3.1 of TESSY from Hitex Development Tools, a tool for automated unit / module / integration testing of embedded software, features additional coverage measures and can also generate test cases from given values. With the additional coverage measures TESSY adheres better to the requirements of different standards with respect to functional safety.
Wireless Test Set enables Insights into LTE-Advanced Category 6 Chipsets25 February 2014 – Agilent Technologies introduced the E7515A UXM wireless test set, a highly integrated signaling test set created for functional and RF design validation in the 4G era and beyond. The UXM provides a broad range of capabilities that enable testing of the newest wireless device designs, delivering LTE-Advanced category 6 now and handling increasingly complex test cases in the future.
Full bi-directional Cat 6 LTE-A Mobile Handset Test Capability24 February 2014 - Aeroflex announced that the 7100 Digital Radio Test Set provides LTE-A carrier aggregation testing at full Cat 6 data rates of 300 Mbps downlink and 50 Mbps uplink simultaneously for LTE-A in FDD mode, and now also supports carrier aggregation in TDD mode. The Cat 6 capability is available via an upgrade to the standard 7100 software and the use of a RF combiner, allowing users to maximize the potential of their existing test equipment investment.
Digital Predistortion simplifies Evaluation of Envelope Tracking Amplifiers20 February 2014 - The new R&S SMW-K541 digital predistortion option from Rohde & Schwarz allows users to import predistortion coefficient tables directly into the R&S SMW200A. The signal generator uses these delta values to adjust the baseband signal in realtime. The option greatly reduces test times since predistorted waveforms no longer have to be tediously recalculated and imported into the generator.
ASSET announces support for ARM64 bit Architecture20 February 2014 - At the upcoming Embedded World Exhibition and Conference from February 26-28 in Nuremberg, Germany, ASSET InterTech (Hall 4, Stand 4-100) will be announcing support for ARM64 bit architecture. Arium SourcePoint debugger from ASSET will support the ARM Cortex-A57 and Cortex - 53 processor architectures. The ARM Cortex- A57 is ARM’s highest performing processor, designed to further extend the capabilities of future mobile and enterprise computing applications including compute intensive 64-bit applications such as high-end computer, tablet and server products.
SuperSpeed USB 10 Gbps (USB 3.1) Protocol Analyzer18 February 2014 - Teledyne LeCroy introduced the Voyager M310, a comprehensive protocol analyzer exerciser platform for testing next generation SuperSpeed USB 10 Gbps (USB 3.1) systems. Fully backward compatible with legacy USB links, the Voyager M310 is designed to provide 100% faithful capture of 10 Gbps bus and protocol traffic for USB 3.1 devices and systems. This multifunction test platform also offers an integrated host and device traffic generation option allowing developers to emulate faulty link conditions, verify protocol compliance and improve product reliability.
Faster, easier Debugging of DDR Devices12 February 2014 – Agilent Technologies introduced a debugging tool that helps DDR memory designers perform precompliance tests, discover the root cause of compliance failures, and maximize design margins. The tool allows designers to easily navigate to areas of interest for further analysis and collect and analyze statistical data. The DDR3 and LPDDR3 debug tool runs on Infiniium 9000A, 90000A, 90000 X- and 90000 Q-Series oscilloscopes. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |