|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestAXI CT System with unprecedented Detail Visibility01 March 2016 - With the new release of the FF20 CT und FF35 CT systems for computed tomography and thanks to a brand-new 190 kV nanofocus tube, YXLON now achieves in the case of 2D applications an as yet unparalleled detail visibility ≤ 150 nm even at high energies. New CT algorithms provide optimum spacial resolution and care for highest precision and time efficiency at a large range of CT applications. Multistandard Test Solution for RF and Audio Tests on Bluetooth Modules29 February 2016 - The modules used in Internet of Things (IoT) applications often combine Bluetooth with other wireless interface technologies. The R&S CMW500 wideband radio communication tester is the only test platform on the market to offer a one-instrument solution for testing all cellular and non-cellular standards and Bluetooth. Rohde & Schwarz has now expanded it leading test platform to include Bluetooth audio tests for manufacturers of Bluetooth headsets and audio car kits. Vector Network Analyzer Options for Active Multiport Module Test25 February 2016 – Keysight Technologies introduced a series of hardware and software options for the M9485A high-performance PXIe multiport vector network analyzer (VNA). The options further enhance the modular nature of the M9485A VNA by adding a range of new capabilities in support of applications such as base transceiver station (BTS) component test and active multiport module test. Multi-Core Debugging and Test Automation23 February 2016 – PLS Programmierbare Logik & Systeme has not only expanded the latest version of its Universal Debug Engine (UDE) with a number of additional trace and debugging functions, but has also added completely new features for test automation. This now enables users to utilize the enormous performance of the newest multicore System-on-Chip (SoC) families, with as few restrictions as possible. PLS is presenting the new UDE 4.6 at embedded world 2016 in Hall 4, Booth 310. Test of higher-order Modulation Modes in LTE and LTE-A22 February 2016 - Modulation methods such as 256QAM and 64QAM in LTE and LTE-Advanced (LTE-A) increase data rates in both the downlink and uplink. Rohde & Schwarz now offers these innovative steps on the R&S CMW500 wideband radio communication tester. At Mobile World Congress, Rohde & Schwarz demonstrates RF tests for LTE-Advanced carrier aggregation with four component carriers in the downlink. The solution consists of the R&S CMWflexx setup, containing two R&S CMW500 and one R&S CMWC controller. Free DFT Extension for Altium Designer19 February 2016 – XJTAG, a supplier of boundary scan technology, will officially launch the XJTAG DFT Assistant for Altium Designer at Embedded World 2016, Nuremberg, Germany (Hall 4, Stand 4-641). Developed by XJTAG, the free software extension for Altium Designer significantly increases the Design for Test capabilities of the unified schematic capture and PCB design system. Monitor and analyze SATA Express and NVM Express Traffic18 February 2016 – Teledyne LeCroy announced an interposer probe for analysis of PCIe External Cable 3.0 ports that utilize the new PCI Express External Cabling Specification Revision 3.0, developed by the PCI-SIG. The PCIe External Cable 3.0 Interposer, which is used with Summit Protocol Analyzers, enables PCIe bus traffic between a system board and storage devices using PCIe External Cable 3.0 cables to be monitored, captured and recorded for protocol analysis. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |