|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestSignal Quality Analyzer for High Speed Serial Transmissions15 June 2015 – Anritsu Corporation launched new MP1861A MUX and MP1862A DEMUX modules for the MP1800A Signal Quality Analyzer. This will expand the functions of the MP1800A 32G BERT to support 56G and 64G BER measurements required for evaluating high-speed serial transmission devices, such as SERDES. When used in conjunction with the MP1800A, the two new modules support a generation of NRZ Data and BER measurements up to 64.2 Gbit/s. In addition, the support for Jitter Tolerance and Bathtub Jitter measurements meets the recommendations of the latest CEI-56G and 400GbE standards. In order to address the ever increasing demands for speed and capacity, the server, storage and communications markets are moving towards the conversion to parallel lanes, with an increase in serial transmission speeds and the adoption of PAM transmission. At the same time the IEEE is examining a switch from 100GbE to 400GbE, and the Optical Internetworking Forum (OIF) is examining new-high-speed interfaces, such as upgrading from CEI-28G to CEI-56G. “The result of this extensive standards work is a requirement to test these new capabilities, and to ensure the new technologies can be reliably built and deployed in the field using the newest standards for the required high speed interfaces” said Jonathan Borrill, Director of Marketing at Anritsu (EMEA). “The breadth of functionality that the MP1800A series offers will help make these higher speeds for server and network equipment possible sooner”. Anritsu’s MP1800A Signal Quality Analyzer series is a plug-in, modular-type Bit Error Rate Tester (BERT) simultaneously accommodating Pulse Pattern Generator (PPG), Error Detector (ED), synthesizer, and jitter generation modules. It supports simultaneous generation of synchronous signals and measurement of Bit Error Rates (BER), for up to 8 channels, by installing multiple 32G PPG and ED modules. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |