|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - General T&M
Signal Quality Analyser enables multi-channel BER Measurement of 1 Tbit/s Transmissions19 September 2014 - Anritsu introduced a 32-channel synchronisation function for 32 Gbit/s data signals, an upgrade to its popular MP1800A Signal Quality Analyser. The new function enables the configuration of highly accurate test systems for the measurement of the next generation of ultra-fast communications technologies operating at speeds of 400 Gbit/s and 1 Tbit/s. When equipped with the upgrade, up to four MP1800A mainframe units, each with an 8-channel 32 Gbit/s pulse pattern generator (PPG) may be synchronized. They may then be used to measure the operation of new communications technologies, such as Quad DP-16QAM and Dual DP-64QAM, which exploit phase modulation methods as a means of expanding core network capacity while limiting the bit rate per channel. Installing either four two-channel or two four-channel 32 Gbit/s PPG boards in four connected MP1800A mainframes provides 32 channels of 32 Gbit/s, offering a transfer capacity of 1 Tbit/s. With a high-accuracy function for adjusting the phase in 2-mUI (milli-Unit Interval) steps, the 32 Gbit/s PPG installed in the MP1800A enables easy configuration of a test system that offers accurate phase control. Additionally, high repeatability can be achieved, because the PPG’s 32 Gbit/s data-signal bit pattern itself can be generated at any timing interval. By adding this new 32-channel 32 Gbit/s PPG synchronisation upgrade to its MP1800A test solution, Anritsu is expecting to help researchers, equipment manufacturers and network operators to move forward more quickly with the implementation of next-generation, ultra-fast communications network technology. Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |