This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

News - Service/Maintenance Test

New PXI-based dual-channel AWG and 8-channel Oscilloscope

NI PXIe 5172 Oscilloscope22 May 2017 - National Instruments (NI) released a new family of PXI arbitrary waveform generators with up to two channels and 80 MHz of analog bandwidth in a single slot, and a new 100 MHz, 8-channel oscilloscope that builds on NI’s expertise in high-density and software-designed instruments in PXI. Engineers can achieve high-performance signal generation and measure complex waveforms with these new low-cost, compact mixed-signal instruments in a modular form factor.

The new PXIe-5413, PXIe-5423, and PXIe-5433 arbitrary waveform generators deliver -92 dB of spurious-free dynamic range and 435 fs integrated system jitter while providing precise waveform adjustment when used with a dedicated standard waveform generation engine. With a new fractional resampling architecture for arbitrary waveform generation, similar dynamic range and jitter performance is available independent of user sample rate. Users also benefit from the high-speed waveform streaming capabilities and multiple-instrument synchronization synonymous with PXI.

 Key features of the PXIe-54x3 arbitrary waveform generators include:

  • Up to two independently controlled output channels
  • Maximum ±12 V and minimum ±7.75 mV output ranges
  • Options for 20, 40 and 80 MHz in a single PXI slot

The new PXIe-5172 oscilloscope includes a user-programmable FPGA. Engineers can use LabVIEW to customize this oscilloscope’s firmware, such as adding in-line signal processing or advanced triggering.

 Key features of the PXIe-5172 oscilloscope include:

  • Highly flexible with 100 MHz, 250 MS/s and 8 channels
  • Input voltage range of up to 80 V peak-to-peak with ±20 V DC offset
  • Support for external sample and reference clocks

“Test engineers need the best technology available at the right price and channel counts to meet their cost, complexity and time-to-market requirements,” said Luke Schreier, director of automated test product marketing at NI. “The new family of arbitrary waveform generators provide software continuity with our NI-FGEN drivers for simple technology insertion, and the new oscilloscope includes a user-programmable FPGA to customize functionality for different applications. We believe the software-centric and standardized hardware approach in PXI for automated test, both in the laboratory and production environments, offers the flexibility to balance continuous innovation with proven measurement technologies.”

www.ni.com/



Related Articles:

Upcoming Events

Automotive Testing Expo Europe 2024
Stuttgart (Germany)
04 to 06 June
PCIM 2024
Nuremberg (Germany)
11 to 13 June

  More events...
  See our Trade Show Calendar
  Click here