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Latest Test and Measurement NewsOptimized In-line High Density In-Circuit Test System
The Keysight i3070 Series 7i solves this issue by providing manufacturers an automated testing process that substantially reduces overall test time. The award-winning i3070 Series 7i ICT system increases capacity up to 5760 nodes on a slim in-line footprint to meet complex testing requirements and enables the processing of larger panels. The Keysight i3070 Series 7i provides the following benefits:
Carol Leh, Vice President and General Manager for Keysight's Electronic Industrial Solutions Group's Center of Excellence, said: "We are committed to offering best-in-class solutions that enable our customers to innovate and succeed. Manufacturers are facing growing demand to provide more efficient and complex testing and Keysight is addressing this challenge head on. The Series 7i offers a ground-breaking new approach, delivering improved capacity and enhanced coverage with efficiency built from the start. In addition, with backward compatibility, customers can enjoy peace of mind and continue their journey knowing existing investments will be protected." Keysight will demonstrate the new i3070 Series 7i inline high-density ICT at productronica 2023 in Munich, Booth A1.576 November 14-17, 2023. www.keysight.com/ Related Articles: |
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