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First VNA capable of 70 kHz to 220 GHz Measurements in a Single Sweep

Anritsu ME7838x04 August 2020 – Anritsu Corporation demonstrated its unique new Vector Network Analyzer (VNA), which can make measurements from 70 kHz to 220 GHz in a single sweep. The ME7838G, together with MPI’s 200mm probe station, allows on-wafer measurements that span into the upper mmWave frequencies for more accurate device characterization.

Anritsu will demonstrate its unique new Vector Network Analyzer (VNA) at three major institutes and universities in Europe this year, with further events to follow in 2021. The first stop on the tour is in August at ETH Zurich at the Institute of Electromagnetic Fields (IEF) in Switzerland, which researches the wave and particle characteristics of electromagnetic fields at all frequencies.

From September 21st, engineers can see the demo at the Université Grenoble Alpes in France at its department of Centre Interuniversitaire de MicroElectronique et Nanotechnologies (CIME), while in November, the demo will be hosted by Chalmers University of Technology in Sweden at its department of Microtechnology and Nanoscience.

The VectorStar-based broadband system gives engineers confidence in the systems they are designing by characterizing the devices from near-DC to well beyond the operating frequency, allowing more accurate modeling.

Features and benefits of the Anritsu VectorStar ME7838G include:

  • Broadest frequency coverage to 220 GHz, with extensions to 1.1 THz
  • Eliminates the time-consuming, error-prone concatenation process across the RF, microwave, and mmWave bands
  • Modular architecture allows system to grow as needed
  • Reduces the risk of waveguide band extrapolation error in device modelling

With the VectorStar ME7838x series, RF and microwave engineers now have a powerful measurement tool for analyzing the performance of devices ranging from transistors in an on-wafer environment, to communication systems in commercial or defense applications.

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