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Latest Test and Measurement NewsCurrent Probe for measuring fast Current Transients12 June 2018 - Power Electronic Measurements (PEM UK) Ltd launched the CWTMini50HF current probe for high-speed and high power-density power electronic applications. This higher bandwidth probe is ideal for measuring the faster current transients in today’s new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes. PC-based Oscilloscopes with flexible Resolution up to 16 Bits11 June 2018 - Pico Technology introduced the PicoScope 5000D Series FlexRes oscilloscopes and MSOs that feature up to 16 bits of vertical resolution with up to 200 MHz bandwidth and 1 GS/s sampling speed. FlexRes hardware employs multiple high-resolution ADCs at the input channels in different time-interleaved and parallel combinations to optimize either the sampling rate to 1 GS/s at 8 bits, the resolution to 16 bits at 62.5 MS/s, or other combinations in between. Improved inspection of Solder Pastes, Sinter Pastes and DCB Substrates08 June 2018 - GOEPEL electronic has upgraded the inline inspection system SPI Line · 3D. In addition to 3D solder paste inspection, the SPI Line · 3D now has new features for testing sinter pastes and Direct Copper Bonded (DCB) substrates. Due to the high precision of the system in conjunction with the new functions, process errors in sinter paste printing can now also be detected. Even the smallest defect structures such as voids and particles with heights below 20 µm can be detected with reproducible results. Current Sensors for high Accuracy low Noise Measurement07 June 2018 - LEM expands its range of high accuracy transducers with the IN 1000-S, for non-intrusive & isolated measurement of DC, AC & pulsed nominal current of 1000 A. IN 1000-S offers an extended operating temperature range of -40 to +85°C for use in a wider range of applications in addition to labs these include test equipment for traditional industrial applications, medical equipment, precision motor controllers & metering. PCI Express Test Solution with Multivendor Oscilloscope Support06 June 2018 – Anritsu developed a PCIe test and compliance test solution in collaboration with Granite River Labs (GRL) and Teledyne LeCroy. The test solution supports both PCI Express transmitter and receiver tests using automation software for the MP1900A. It also enables connection of customers’ oscilloscopes with the MP1900A by supporting real-time oscilloscopes from the three main manufacturers, permitting automation of complex receiver tests required for evaluating devices in accordance with the PCI Express standards. DDR5 and LPDDR5 Protocol Debug and Validation Solutions05 June 2018 - Keysight Technologies announced the first DDR51 and LPDDR52 Protocol Debug and Validation solutions. These solutions, when used in conjunction with Keysight's U4164A logic analyzer, enable designers of enterprise servers, mobile devices, and wireless equipment to debug and test DDR5 and LPDDR5 systems as well as validate protocol compliance. Background: LXI Security04 June 2018 - Security is a critical attribute of industrial networks and Industry is giving a growing amount of attention to cybersecurity issues. Since LXI instruments are connected to company networks cybersecurity is also an important topic for LXI. This article gives an overview on the general security concepts and provides a summary of the current state of the LXI Security Working Group discussions and proposals for Test Engineers setting up LXI based test systems and IT departments supervising the company network. More Articles ...
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