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Latest Test and Measurement NewsHigh Power DC Electronic Loads up to 500 V, 720 A20 October 2017 -- B&K Precision announced the expansion of its 8600 Series with the addition of four new programmable DC electronic load models: 8620, 8622, 8624, and 8625. With operating voltage ranges up to 500 V, the new models bring to the series a significant increase in power range from 2500 W to 6000 W and a capability of sinking up to 720 A for high current applications. Safety and Reliability Test for ADAS and Autonomous Vehicles19 October 2017 – National Instruments (NI) announced a new Vehicle Radar Test System providing object simulation and radar measurement capabilities for engineers testing autonomous driving technology. The Vehicle Radar Test System (VRTS) can be used to test 76–81 GHz radar technology from the R&D lab through high-volume production test and from individual radar sensors to integrated advanced driver assistance systems (ADAS). Vector Network Analyzer Calibration Solution18 October 2017 - Rohde & Schwarz presents new vector network analyzer calibration equipment: the R&S ZN-Z32 and R&S ZN-Z33 inline calibration units. Unlike conventional automatic network analyzer calibration units, the new R&S ZN-Z32/33 inline calibration units are permanently connected to the test setup. This makes them an ideal solution for test setups that require frequent recalibration, especially where the test setup is inaccessible. Solid State Field Generating Systems16 October 2017 - AR RF/Microwave Instrumentation introduced a line of state-of–the-art solid state field generating systems for numerous markets and applications. The products offer a very attractive alternative to using Traveling Wave Tube Amplifiers (TWTAs) driving separate antennas to generate field strength up to 50 V/m. Active Probe Solution for Emerging High-Speed Links13 October 2017 – Introspect Technology offers the PV1 Active Probe, an in-system measurement solution that is compatible with any 50 Ohm instrument whether it be an oscilloscope, a protocol analyzer, or a spectrum analyzer. The PV1 is ideal for probing full-width data transfer links such as those found in MIPI CSI-2 or DSI/DSI-2 system implementations. And by having a completely non-proprietary instrument interface, it dramatically enhances productivity by facilitating the attachment of a wide range of instruments to devices under test while minimizing circuit loading and maintaining signal integrity. Comprehensive PCI Express 4.0 Test System12 October 2017 - Anritsu Company U.S. and Teledyne LeCroy announced a partnership to provide the industry’s most capable PCI Express 4.0 (PCIe Gen4) test solution, integrating the Anritsu Signal Quality Analyzer (SQA) MP1900A BERT with the LabMaster 10Zi-A oscilloscope and QPHY-PCIe4-Tx-Rx software from Teledyne LeCroy. This comprehensive system provides high-speed IC, device, and network engineers with one complete solution to conduct automated transmitter and receiver compliance tests, as well as link equalization verification. High-Throughput 1 ns Pulsed IV Memory Test Solution11 October 2017 – Keysight Technologies announced a solution to characterize magnetic tunnel junction (MTJ) for spin transfer torque magnetoresistive random access memory (STT-MRAM) to overcome challenges of conventional rack and stack base test environments. Keysight’s new NX5730A High-Throughput 1 ns Pulsed IV Memory test solution is a dedicated solution for researchers and engineers struggling with the characterization of MTJ devices on silicon wafers. More Articles ...
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