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Latest Test and Measurement NewsAnritsu signs UK Distribution Agreement with Electro Rent19 May 2016 – Anritsu Corporation announced that they have signed a distribution agreement with Electro Rent UK, a provider of new and used test equipment for rent, lease or purchase. The distribution agreement extends Electro Rent's existing relationship with Anritsu as a preferred reseller and rental partner in the United States and Canada. Under the terms of the new agreement, Anritsu’s industry-leading field analysers will be now also be available in the UK through Electro Rent. New Kind of Analyzer for Advanced Device Characterization19 May 2016 – Keysight Technologies introduced the world’s first analyzer enabling a minimum of 100-pA level dynamic current measurements with a maximum of 200 MHz bandwidth, 1 GSa/s sampling rate and 14- or 16-bit wide dynamic range. The Keysight CX3300 Series Device Current Waveform Analyzer is a new category of instrument and is ideally suited for researchers struggling with high-speed transient current measurements during advanced device characterization and engineers working to reduce power/current consumption in low-power devices. Test Adapters for NVMe Dual Port U.2 Drive Testing18 May 2016 – Teledyne LeCroy introduced dual port U.2 test fixtures used for isolating NVMe U.2 drives for data storage system testing. The test fixtures (called transposers) are offered as a set of four adapters, each of which provides a unique test configuration for isolating dual port U.2 drives in data storage systems. Interoperability test engineers now have a simple test tool that will help ensure that dual port drives will behave effectively in mission critical systems. Validation of LTE-Advanced Pro Uplink 64QAM and LTE-Advanced Uplink CA17 May 2016 - The R&S TS8980 RF conformance test system from Rohde & Schwarz has achieved the world's first validation for both LTE-Advanced uplink carrier aggregation (UL CA) and LTE-Advanced Pro uplink 64QAM (UL 64QAM). RF conformance is a critical part of device certification as specified by the Global Certification Forum GCF. Mobile manufacturers that use the most advanced chipset solutions will now be able to certify their devices in line with GCF requirements for UL CA and UL 64QAM. High-Density 2 Amp PXI Relay Module13 May 2016 - Pickering Interfaces announced a new High-Density 2 Amp PXI Relay Module. Configured with 83 SPDT relays the model 40-100 was originally designed for applications in Aerospace and Defense requiring a higher density 2 Amp alternative to Pickering’s current 52 SPDT Module (model 40-139). This new Relay Module is suitable for applications requiring medium power switching with very high density. It features a 2 Amp current capacity and voltages to 200VDC/140VAC. Tunable Laser Sources for Testing Data Center Devices12 May 2016 – Keysight Technologies introduced the 81602A, an extra high power tunable laser. The 81602A eases tolerance for power budgets in test setups and speeds fiber or probe alignment by getting first light faster. Keysight also introduced new wavelengths for its recently released 8160xA family of tunable laser modules for the 8164B lightwave measurement system. Integrated Boundary Scan in Flying Probe Testers12 May 2016 - GOEPEL electronic introduced a boundary scan option for the Pilot 4D Flying Probe Testers (FPT) of SEICA. The combination of the two test procedures provides a cost-effective and time-efficient platform for testing electrical assemblies in production. The solution is based on the boundary scan software “SYSTEM CASCON” of Goepel electronics. More Articles ...
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