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Latest Test and Measurement NewsPico Technology celebrates 25th Anniversary20 June 2016 - In July 2016 Pico Technology will celebrate 25 years of business. Pico data loggers, oscilloscopes and signal generators are used by engineers, scientists and technicians around the globe to bring their products to market. Pico automotive diagnostics products help keep the wheels turning for vehicle manufacturers and service organizations on every continent. High-Speed 14 and 16 bit PXIe Digitizers17 June 2016 - Spectrum has released its first high-speed digitizer product line based on the popular PXIe (PXI Express) modular instrumentation standard. The M4x.44xx series consists of six new products, each packaged in a dual-width 3U module and incorporating a four lane PCI Express Generation 2 interface. The high-performance interface allows data transfer speeds in excess of 1.7 GB/s, making the cards ideal for use in today’s fastest PXIe mainframe systems. RF Conformance Tests for LTE band 14 public Safety Networks16 June 2016 - Rohde & Schwarz has validated six RF conformance test cases for LTE-capable high-power user equipment (HPUE), allowing the certification of such devices to start. The R&S TS8980 test system is the first and so far only test system that covers these tests for LTE band 14 public safety networks. With this accomplishment, Rohde & Schwarz is paving the way for LTE's expansion into critical communication applications. Faster 3D X-Ray Inspection15 June 2016 - GOEPEL electronic announced the newest version of the industry proven X-ray inspection system X Line·3D. The new Series 300 is a pioneering solution for automatic inspection of double-sided PCBs combining 3D AXI and AOI into one system. Mechanical changes and a revision of the system software enhance test speed for even higher cycle times with lower maintenance requirements. Comprehensive 100G Ethernet Compliance Test Software15 June 2016 – Keysight Technologies introduced the industry’s most comprehensive compliance application software for testing electrical characteristics of 100G four-lane attachment unit interface (CAUI-4) networking applications. The software supports the IEEE 802.3bm standard, which accommodates optical networking advances and enables higher density applications. Die-Level Handling System for KGD Test Strategy14 June 2016 – Advantest Corporation introduced its HA1000 die-level handler, a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging. The HA1000 is designed to handle a wide variety of devices from large high-power server/GPU type devices to small system-on-chips (SoCs) and memory devices/stacks, such as HBM2. Tektronix expands Serial Standards Testing on DPO70000SX Oscilloscopes13 June 2016 - Tektronix is enabling serial bus test support for 4th generation standards including USB3.1, Thunderbolt over USB Type-C, PCIe Gen4 and DDR4 on the DPO70000SX Series. This new oscilloscope family offers incredible signal fidelity enabling precise margin analysis on 4th generation serial data rates beyond 10Gb/sec. Featuring patented Asynchronous Time Interleaving (ATI) signal acquisition technology, the DPO70000SX platform offers industry-best signal fidelity and performance coupled with a scalable architecture. More Articles ...
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