|News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.|
Readers Top 5 News of last 30 days
Latest Test and Measurement News
National Instruments Announces PXI RF Vector Network Analyzer
09 August 2010 – National Instruments introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test.
30 MHz Function/AWG with Unparalleled Signal Accuracy
05 August 2010 - Agilent Technologies introduced the 33521A 1-channel function/arbitrary waveform generator and the 33522A 2-channel function/arbitrary waveform generator. The 33521A and 33522A are members of the Agilent 33500 Series family of function/arbitrary waveform generators and offer unparalleled signal accuracy.
LTE Conformance Test System with GCF and PTCRB approval
04 August 2010 - Anritsu’s ME7873L RF Conformance Test System and ME7832L Protocol Conformance Test System for testing LTE mobile terminals have already received GCF approval and now have received PTCRB approval for 30 (ME7873L) and 20 (ME7832L) test cases supporting the wireless bands used in North America (Band 4, 13, 17, etc.).
NI LabVIEW 2010: New Functions and Faster Code Execution
03 August 2010 – National Instruments announced LabVIEW 2010, the latest version of the graphical programming environment for design, test, measurement and control applications. LabVIEW 2010 delivers time savings with new features such as off-the-shelf compiler technologies that execute code an average of 20 percent faster and a comprehensive marketplace for evaluating and purchasing add-on toolkits for easily integrating custom functionality into the platform.
Handheld Spectrum Analyzer Makes Infield Measurements Easier
03 August 2010 - Agilent Technologies introduced the N9342C handheld spectrum analyzer (HSA), a powerful and straightforward instrument designed for RF technicians and engineers performing installation, maintenance and surveillance of RF systems in the field. The N9342C HSA makes field testing easier by providing faster, more precise measurements, ease of use, and a range of user customization and ergonomic features.
XJTAG supports Micron Phase Change Memory
23 July 2010 - XJTAG announced that it is the first to provide support for Micron Omneo™ Phase Change Memory (PCM). XJTAG provides test and development tools for high speed programming of Micron Phase Change Memory. Also XJTAG produces white paper on high speed programming of non-volatile Memories.
Test Vector Interface for IEEE1450 (STIL)
09 July 2010 - GOEPEL electronic introduces a new test vector interface as a new extension of its software platform SYSTEM CASCON. The newly developed vector link is based on IEEE1450 – Standard Test Interface Language (STIL) – and enables the seamless coupling during test pattern export, in particular to chip testers.
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