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Latest Test and Measurement NewsRF Power Sensor Calibration via MET/CAL20 March 2015 - TEGAM announces new RF Power Sensor Calibration procedures designed to operate on the Fluke Calibration MET/CAL software platform. Many calibration laboratories use MET/CAL to automate the calibration, data storage and asset tracking of their DC and Low Frequency workload. These same features are now available for the valuable and complex process of RF power sensor calibration. New Loader for Test in Carriers19 March 2015 - Multitest launched the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume production sites. The InCarrierplus supports the device loading to carrier from standard back-end transport media in a most cost-efficient and productivity-oriented way. Vector Network Analyzer with Tenfold Faster Test Times18 March 2015 – Keysight Technologies announced the E5080A ENA vector network analyzer (VNA), which offers the industry’s best combination of RF measurement performance and speed, enabling a tenfold improvement in test time. The new ENA uses the Keysight PNA- and PXI-Series software architecture, making it easier for engineers to take measurements across multiple Keysight VNAs. The ENA also offers a large color touchscreen display with fast access to basic measurements. USB and LAN Diode Sensors for fast and accurate Power Measurements18 March 2015 - Rohde & Schwarz has enhanced its sensor portfolio with the new R&S NRPxxS and R&S NRPxxSN USB three-path diode power sensors. The new models offer even more flexibility. In addition to the well-established USB sensors, new sensors that support LAN are now available. LAN is the ideal choice for remotely controlled applications over large distances. The completely redesigned sensors offer unprecedented measurement speed and measurement accuracy, even at low levels. Overlay and Films Process Control Solutions for advanced IC Processes17 March 2015 - KLA-Tencor Corporation introduced two advanced metrology systems that support the development and production of 16nm and below IC devices: Archer 500LCM and SpectraFilm LD10. The Archer 500LCM overlay metrology system provides accurate overlay error feedback through all stages of the yield ramp, helping chipmakers resolve overlay issues associated with innovative patterning techniques, such as multi-patterning and spacer pitch splitting. OTA Performance Testing16 March 2015 - Bluetest recently added air interface testing for Bluetooth and TD-SCDMA and completes its line-up of supported wireless standards enabled by the Rohde & Schwarz CMW500 Wideband Radio Communication Tester. The easy to use Bluetest Measurement Suite software controls the R&S CMW500 Wideband Radio Communication Tester as well as the Reverberation Test System (RTS) producing fast and accurate Over the Air (OTA) measurements of the wireless device under test. Network Tester to support LTE-A Release 11 CoMP16 March 2015 – Cobham Wireless, formerly Aeroflex wireless business unit, announced that the TM500 network tester family now also supports Coordinated Multipoint transmission/reception (CoMP), a major feature of 3GPP LTE-A Release 11. The TM500 already supports key LTE-A features such as carrier aggregation of two and three component carriers, TDD/FDD carrier aggregation, and eICIC. More Articles ...
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