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Latest Test and Measurement News
Advantest Introduces new Test Modules for Next-Generation RF-based ICs12 March 2014 - Advantest Corporation introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s widely used T2000 platform.
Optical Spectrum Analyser for 600-1700 nm Wavelength Range12 March 2013 - The new Yokogawa AQ6370D benchtop optical spectrum analyser, the successor to the company’s best-selling AQ6370C, incorporates a number of new functions designed to enhance its accuracy and analysis capabilities in the 600-1700 nm wavelength range. Newly added functions include data logging, gate sampling, resolution calibration, an advanced marker function and an enhanced auto-sweep mode.
Protocol Analyzer with Support for SSIC, CSI-3 Interfaces11 March 2014 - Agilent Technologies introduced SSIC and CSI-3 support for its U4431A MIPI M-PHY protocol analyzer for next-generation mobile computing applications. This protocol analyzer support gives engineers in R&D and manufacturing deep insight into their MIPI M-PHY-based designs. CSI-3 (Camera Serial Interface) leverages the CSI-2 protocol of the D-PHY physical layer to the higher-performance M-PHY. SSIC (SuperSpeed USB Inter-Chip) allows USB-enabled functionality to work in M-PHY-based mobile systems.
Compact Real-time Spectrum Analyzer covering from 9 kHz to 6 GHz11 March 2014 - Test Equipment Plus announced the Signal Hound BB60A real-time spectrum analyzer and RF recorder designed to capture and display RF events as short as 1 µs. The BB60A is a small, lightweight, and affordable USB-based real-time RF spectrum analyzer that operates from 9 kHz to 6 GHz and can go anywhere. It can also be customized to perform complex, remote, and/or automated functions.
Nordson DAGE opened a new Research and Development Facility10 March 2014 - Nordson DAGE opened its new expanded Research and Development facility in Colchester, Essex, UK. The move to the new location had been planned in line with new R & D programs with subsequent headcount expansion to further drive Nordson DAGE’s Bond Test and X-ray product development programs. The move has doubled the space and added important capability including a new cleanroom facility.
Processor Emulation in Combination with Boundary Scan10 March 2014 – GOEPEL electronic developed another TAP Interface Card (TIC), named TIC122, for the modular Boundary Scan hardware platform SCANFLEX. The new TIC Module features a programmable multi-bus interface enabling nearly unlimited compatibility to a multitude of standardized and proprietary microprocessor debug protocols and – simultaneously – supporting all Boundary Scan standards.
Off-the-shelf Solution for IEC/EN 61000-4-3 EMS Measurements07 March 2014 - The new standardized R&S CEMS100 test platform from Rohde & Schwarz is the first flexible and reliable off-the-shelf solution for EMS measurements in line with IEC/EN 61000-4-3. The state-of-the-art platform includes all the components needed for EMS and EMI measurements. It covers all common frequency ranges and field strengths required for precompliance tests and certification. Rohde & Schwarz will be showcasing the R&S CEMS100 next week on the international EMV Düsseldorf 2014 trade fair (booth CCD-202). More Articles ...
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