|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestPneumatic Micro-Switch Probe23 November 2010 – For presence tests at very limited available space, FEINMETALL now offers the pneumatic micro switch probe F899, which combines a pneumatically controlled contact with an integrated switch function. With this small and cylinder shaped probe the correct position of any component or connector can be proved reliably and without major effort. 19 Audio Measurements in 1.2 Seconds22 November 2010 - Audio Precision announces v.2.7 software for its APx range of audio analysers. Available as free upgrade for APx users, the new software offers a host of enhancements, including a new multitone analyser which returns 19 key audio measurements in well under two seconds. New In-System Technology to control of Chip Embedded Test, Debug, and Programming22 November 2010 - GOEPEL electronic introduces ChipVORX, an entirely new in-system technology for the configuration and control of chip embedded test, debug, and programming functions. In its core this powerful solution is based on the utilization of a new communication interface in the software platform SYSTEM CASCON, combined with special function libraries (ChipVORX models) structured as intelligent IP. Dual Head Robotic Prober18 November 2010 - The Huntron Access DH is a new dual head robotic prober that allows for true point-to-point measurements and is designed to be an open architecture platform. Adding custom probe heads to the Access DH is made possible by multiple interface connections (USB, Ethernet, etc...) available on each of the two heads. Precision S/N, C/N, C/No, C/I and Eb/No Measurements18 November 2010 - Noisecom, a Wireless Telecom Group company, has launched its new CNG-EbNo series of precision signal-to-noise generators. These analyzers are designed for Carrier-to-Noise (C/N), Carrier-to-Noise density (C/No), Signal-to-Noise (S/N), Carrier-to-Interferer (C/I) and Bit Energy-to-Noise density (Eb/No) analysis. TestWay Express explores “yield estimation”17 November 2010 - During Electronica 2010 at the New Munich Trade Fair Centre, ASTER Technologies, a supplier of Board-Level Testability and Test Coverage analysis tools, announce a new “yield estimation” feature to the TestWay Express test coverage analysis tool. The issue of calculating first pass yield (FPY) and other IPC quality metrics has become increasingly important in light of the increase in subcontracting the production of high technology products. EDA Software improves Testbench Quality for BSDL Verification12 November 2010 - GOEPEL electronic introduces TAP Checker a new generation EDA software tool for verification of BSDL (Boundary Scan Description Language) files and validation of JTAG implementations in integrated circuits. The innovative tool suite enables the automatic generation of simulation vectors and test patterns for chip-level validation and verification of IEEE 1149.1 and IEEE 1149.6 compliant implementation. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |