|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
News - Board and System TestIndustry’s First Design and Test Solution for 3GPP LTE-Advanced19 January 2011 - Agilent Technologies announced the industry’s first commercially available 4G system design library for 3GPP Release 10 -- the W1918 LTE-Advanced library. The new system design library is available as an option to Agilent’s SystemVue 2011.03 release software. Wireless system architects and chipset makers working to provide the 4G network 1-Gbps peak download speed can now use Agilent’s W1918 LTE-Advanced library for earlier verification of physical layer (PHY) algorithms and system performance. Boundary Scan Test Vector Migration into SPEA 3030 Board Testers10 January 2011 - In cooperation with its German GATE program partner TAP (Tietjen Automatisierte Prueftechnik) GOEPEL electronic has developed a software tool that converts test vectors, generated in SYSTEM CASCON, into executable test pattern of the SPEA 3030 In-Cicruit tester (ICT). The new method converts the JTAG bus’ serial vectors as well as the parallel I/O vectors to the board test system’s pin electronics. Linearization of active RF Components with Analysis Software07 January 2011 - Rohde & Schwarz has introduced the R&S FS K130 distortion analysis software for optimizing active RF components such as power amplifiers and mixers. This software allows users to characterize and linearize amplifiers quickly and easily. The R&S FS-K130 even compensates for memory effects exhibited by many of today's amplifiers. The test setup consists of a spectrum analyzer, a signal generator, and a PC. Software Automates In-Circuit Test Coverage Reports21 December 2010 - Agilent Technologies Inc. introduced a fast and easy-to-use test coverage prediction tool: N1194A Agilent Test Coverage Consultant (ATCC). The software performs two significant tasks. First, it measures the test coverage of a product after the tests have been developed. Second, it quickly predicts the test coverage of a product based only on the CAD layout files. 80MHz-1GHz Amplifier with 250W Output17 December 2010 - Accelonix announced a 250W amplifier from MILMEGA with a bandwidth of 80MHz to 1GHz designed for EMC applications. MILMEGA has been designing and manufacturing Microwave and RF Solid state amplifiers for over 20 years. PXI Express Boundary Scan Controllers14 December 2010 - GOEPEL electronic announced another series of special controllers with PXI Express interface within the frame of the JTAG/Boundary Scan hardware platform SCANFLEX. The new family of SCANFLEX Boundary Scan controllers (SFX Controller) is named SFX/PXIe1149/C(x) and includes altogether nine models with different signal conditions and performance classes. MIL-STD-1553 Mini-PCIe Board13 December 2010 - Data Device Corporation (DDC) introduces a new MIL-STD-1553 Mini-PCIe board allowing a dual redundant MIL-STD-1553 channel to be easily added to any small embedded system, rugged laptop, or rugged tablet computer, providing a cost effective, light weight, small size, rugged, and reliable MIL-STD-1553 bus interface. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |