|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsPXI Multifunction Instrument combining Measurement and Control Functions22 September 2020 - Marvin Test Solutions launched the new GX3722 Series Multifunction Analog and Digital I/O Instrument. The GX3722 delivers exceptional flexibility and utility, with a unique mix of measurement and control functionality, in a single high-performance 3U PXI hybrid slot compatible instrument. Analog measurement capabilities include four time-interval channels, each rated at 10 MHz, with channels supporting both 50 Ohm and 75 Ohm input impedance. Two digitizer channels, each with a maximum sampling rate of 10 MS/s, include programmable input impedance and sampling rates with a 24 Vpp input range. Two channels of multifunction waveform generation deliver Sine, Triangle, Sawtooth, Square, and Arbitrary signals up to 10 MHz, while four channels of dedicated square wave generation further complement the source capabilities of this card. The addition of four 100 kHz differential TTL I/O channels and three open collector output channels (50 V, 2.0 A) enable control of external devices. “The GX3722 delivers a unique combination of measurement and control functionality ideal for small to medium size systems” said Jon Semancik, Director of Marketing for Marvin Test Solutions. “And the ruggedized, extended temperature version is perfect for customers deploying test systems in extreme, harsh environments.” The GX3722 Series is supplied with GxFPGA, a software package that includes a virtual instrument panel, and a Windows 32/64-bit DLL driver and documentation. Interface files are provided to support access to programming tools and languages such as ATEasy, LabVIEW, C/C++, Microsoft C# and Visual Basic .Net. A Linux driver is also provided with the GtLinux software package. www.marvintest.com/ Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |