This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

Highly scalable Test Platform for Display Drivers

Xcerra Diamondx IMAx108 October 2018 - Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs.

Touch and display driver integration (TDDI) IC shipments continue to ramp, and are expected to hit the 500 million mark in 2018 (Digitimes, March 28, 2018). Driven by bezel-less display technology popular in the latest high-end smartphone designs, TDDI chips are seeing mainstream adoption after an extended incubation period. TDDI chips offer clear benefits, such as lower cost, a thinner panel assembly, and better performance, over their discrete competitors. TDDI chips present significant challenges, however, for established display driver ATE solutions.

With the addition of the PD2x instrument, a specialized instrument designed to test leading edge display driver IC’s, the Diamondx can help realize the full potential of TDDI. With a scalable universal slot architecture, Diamondx can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. Furthermore, with the introduction of the HSI1x 12.8Gbps SerDes test instrument, the Diamondx has channel count and performance headroom to meet the future needs of the display driver digital interfaces.

Christopher Lemoine, Product Marketing Director, highlights: “Traditional display driver ATE systems are specialized systems designed to test the driver row/column drivers, power management, logic and memory functions found in display driver IC’s. Adding touch controllers to these chips exposes gaps in the capabilities of existing display driver ATE, and the limited scalability of these solutions inhibits the cost benefits of TDDI. With a wide range of general purpose digital, analog, mixed-signal, wireless, and power instrumentation, the Diamondx is a well established leader in touch controller test. With the addition of the PD2x display driver digitizer instrument and the HSI1x 12.8Gbps SerDes test instrument, the Diamondx platform enables our customers to push the boundaries of performance, quality and cost-effectiveness of their TDDI products.”

www.xcerra.com/



Related Articles:

Upcoming Events

Southern Manufactruing 2019
Farnborough (UK)
05 to 07 February 2019
Embedded World 2019
Nuremberg (Germany)
26 to 28 February 2019
Mobile World Congress 2019
Barcelona (Spain)
25 to 28 February 2019
Advertising
Advertising

Social Media

twitter_follow_420x50px