This website uses cookies to implement certain functions. If you use this website you agree to our Privacy Policy.
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation.  

Newsletter

Register to our newsletter
Every two weeks -
all news at a glance
captcha 

Latest Test and Measurement News

Measuring and Evaluating Switching Parameters of SiC, GaN Power Devices

Tek AFG31000s18 October 2019 - Tektronix announced a new software plugin for its AFG31000 Arbitrary/Function Generator that makes it possible to perform crucial double pulse testing in less than a minute, saving a significant amount of time when compared to alternative methods.

With the new Double Pulse Test software, engineers can quickly define pulse parameters from a single window on the AFG31000's large touchscreen display and then generate the pulses they need to perform testing – all in under a minute. The application offers impedance adjustment of pulse width and the time gap between each pulse, up to 30 pulses. Pulse widths can range from 20 ns to 150 µs.

"The new Double Pulse Test plugin is another example of how our new AFG31000 makes it easy to set up test systems, quickly change parameters and run through a range of test cases with high efficiency and stability," said Chris Bohn, vice president and general manager of the Keithley Product Line at Tektronix. "This represents a huge increase in productivity for power engineers, translating into significant cost savings and shorter time to market."

Double pulse testing is used by researchers and design and test engineers in the power and semiconductor industries to measure and evaluate the switching parameters and dynamic behavior of power devices, including those made from wide bandgap materials such as Silicon Carbide (SiC) and Gallium Nitride (GaN).

To perform a double pulse test, an engineer needs to precisely generate at least two voltage pulses with varying pulse widths and timing to trigger a MOSFET or IGBT power device. Measurements are taken with an oscilloscope like a Tektronix 5 Series MSO. However, generating these pulses has been challenging with today's test equipment, forcing researchers and engineers to manually create waveforms using PCs or microcontrollers – a time-consuming and error-prone approach.

AFG31000 Redefines the Arbitrary/Function Generator

Introduced last year, the AFG31000 redefines the arbitrary/function generator with a number of industry firsts in its class, including the largest touchscreen, a new user interface, the patented InstaView™ technology feature that automatically detects and compensates for impedance mismatches, programmable waveform sequencing, and a new ArbBuilder tool for easily creating and editing arbitrary waveforms.

Featuring a 9-inch touchscreen display, AFG31000 series instruments are available in 1- or 2-channel configurations and deliver 14-bit vertical resolution along with 250 MSa/s, 1 GSa/s or 2 GSa/s sample rate performance. Prices start at $2,210 US MSRP.

Availability

Available now, customers can download the Double Pulse Test software for the AFG31000 free of charge from the tek.com website.

www.tek.com/



Related Articles:

Upcoming Events

AMPER 2024
Brno (CZ)
19 to 21 March
Embedded World 2024
Nuremberg (Germany)
09 to 11 April

  More events...
  See our Trade Show Calendar
  Click here

 

Advertising
Advertising