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Latest Test and Measurement NewsUSB Power Delivery and USB Type-C Compliance Tests23 August 2017 – Teledyne LeCroy has released an upgrade for the Voyager USB analyzer platform with enhancements designed to provide 100% coverage of the required USB Power Delivery (PD) and USB Type-C functional compliance tests. The Voyager M310P is a full-featured USB 3.1 protocol analyzer - exerciser system that now supports eye-diagram capture and bit-error-rate test functionality to provide one-stop verification for PD and USB Type-C compliance. Contactor for WLCSP Testing in Customer Evaluation22 August 2017 - Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp. Boundary Scan DFT Assistant for Zuken PCB Design Suite21 August 2017 – Zuken and XJTAG have entered into a partnership to enhance Zuken’s CR-8000 PCB design suite with a design for test (DFT) capability that will improve test coverage during schematic entry. The capability is based on XJTAG’s DFT Assistant, and will be available later this year as a free plugin for Zuken’s CR-8000 Design Gateway users. Signal and Spectrum Analyzer offering 2 GHz internal Analysis Bandwidth18 August 2017 -- Rohde & Schwarz expanded the internal analysis bandwidth of its R&S FSW high-end signal and spectrum analyzer up to 2 GHz by introducing the new R&S FSW-B2001 option. This test solution enables R&D users to investigate wideband signals in detail without the need for an external digitizer. VNAs to Support High Data Rate Requirements of 5G and Data Center Cloud Systems17 August 2017 – Anritsu Corporation introduced the Universal Fixture Extraction (UFX) option for its VectorStar vector network analyzers (VNAs) to provide signal integrity and on-wafer engineers with an increased range of on-wafer and fixture calibration choices, even when a full set of calibration standards is not available. Developed to address the design challenges associated with the high-frequency, high data rate requirements of 4G and emerging 5G systems, as well as backhaul and data centers, UFX features unique analysis tools so engineers can more accurately and efficiently evaluate designs. Comb Generators for EMC Testing16 August 2017 - Saelig Company announced two new TekBox TBCGx Comb Generators for EMC testing. The TBCG1 is a radiating comb generator with an internal dipole antenna and a base frequency of 100 MHz. It radiates a comb spectrum that is characterized up to 6 GHz. The comb generator is intended as a quick reference for testing radiated noise measurements in anechoic chambers, TEM/GTEM cells, shielded chambers, or to gauge the effectiveness of cable shielding and other shielding materials. USB Type-C Test Fixture for Cable Tester15 August 2017 - CAMI Research released a USB Type-C test interface board for its CableEye cable and harness testing systems. A daughter board populated with two USB-C female connectors allows users to continuity-check USB Type-C terminated cables using the CableEye tester while seeing the connectors-under-test rendered graphically. The CB26U fits all CableEye models. More Articles ...
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