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Latest Test and Measurement NewsDigital Attenuator for Frequencies of 0.1 to 6 GHz22 August 2016 - Saelig Company added the TEA6000-95 0.1 to 6 GHz Digital Attenuator to its product portfolio. This new RF signal attenuator operates over a 0.1 to 6 GHz frequency range and can reduce input signal amplitudes by up to 95dB in 0.5dB steps. It features excellent solid-state repeatability and performance, and the output signal is uninterrupted when changing attenuation values. It is powered and controlled using a USB interface. PXI based Digital Test Solution for Semiconductor19 August 2016 - National Instruments (NI) announced the NI PXIe-6570 digital pattern instrument and NI Digital Pattern Editor. This product frees manufacturers of RFICs, power management ICs, MEMS devices and mixed-signal ICs from the closed architectures of conventional semiconductor automated test equipment (ATE). USB Type-C Compliance Test18 August 2016 – Teledyne LeCroy announced the release of the USB Type-C Compliance Suite for the Voyager M310C SuperSpeed USB 3.1 protocol verification platform. Based on USB-IF's USB Type-C Functional Verification Specification, this automated test suite allows developers to verify the logical USB Type-C port operation and verify compliance to the verification specification for devices utilizing the USB Type-C interface. High Volume Test of environmental Sensors17 August 2016 - Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas. High-Volume SSD Manufacturing Test16 August 2016 – Advantest Corporation ( introduced the MPT3000HVM system, providing a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The MPT3000HVM achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration. 4½ digit digital Multimeter with dual Display15 August 2016 - Siglent introduced the SDM3045X - a 4½ digit dual-display digital multimeter that is suited to high-precision, multifunction, and automation measurement applications. It features a combination of basic measurement functions, with multiple math and display choices, and special features including histogram, trend chart, bar chart, statistics, hold measurement, dBm, etc. Keysight expands PXI and AXIe Instrument Offering12 August 2016 – Keysight Technologies expanded its offering of high-performance PXI and AXIe instruments and reference solutions. The new products are part of Keysight’s on-going commitment to deliver unrivaled RF, microwave and digital measurement expertise in the PXI and AXIe instrument form factors. Using the best available instruments—benchtop, modular or a combination—the reference solutions deliver proven hardware and software test configurations for critical applications, including 5G, EW threat simulations and digital interconnect test. More Articles ...
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