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Latest Test and Measurement NewsTektronix introduces 150 MHz Arbitrary/Function Generators19 August 2015 – Tektronix has expanded its AFG3000C Arbitrary/Function Generator Series with two 150 MHz models. Slotting between existing 100 MHz and 240 MHz models in the Tektronix AFG3000C lineup, the new AFG3151C and AFG3152C deliver 25 percent more bandwidth and 59 percent more output zone with +/-5 V DC offset at the same price as competitive offering in this segment. The AFG3000 Series feature an intuitive user interface that shows more information at a single glance, boosting productivity by allowing users to focus on the task at hand. Testing of DRAM Memory ICs with Data Rates up to 16 Gbps18 August 2015 – Advantest introduced a fast fully integrated memory test card, the HSM16G. The new card extends the high-speed testing capabilities of the company’s HSM series of testers to native 16 gigabits per second (Gbps) for at-speed testing of ultra-fast memory ICs. This new product launch makes Advantest the first ATE supplier to provide an integrated test solution that supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16 Gbps. Keysight Technologies acquired Anite17 August 2015 – Keysight Technologies announced that it has completed the acquisition of Anite. Keysight paid approximately $600 million in cash for Anite – a leading supplier of software solutions for wireless research and development – in a deal that supports Keysight’s strategy to grow in wireless and expand its software offerings. PXI-based Wireless Test System optimized for Throughput in Production14 August 2015 - National Instruments (NI) released the Wireless Test System (WTS), a solution that is aimed to lower the cost of high-volume wireless manufacturing test. The WTS combines the latest advances in PXI hardware to offer a single platform for multi-standard, multi-DUT and multi-port testing. When used with flexible test sequencing software, such as the TestStand Wireless Test Module, manufacturers can significantly improve instrument utilization when testing multiple devices in parallel. Flexible and Extendible Solution for SSD Testing13 August 2015 - Advantest offers a new downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs), making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards, enabling SSD manufacturers to leverage one platform to increase their return on investment. Ethernet and Fibre Channel Protocol Analysis12 August 2015 – Teledyne LeCroy released the Net Protocol Suite version 1.80 for the SierraNet and SierraFC family of Ethernet and Fibre Channel protocol analysis and traffic modification and impairment tools. The SierraNet and SierraFC family of protocol analysis test tools are the defining platforms for pin-point determination of events and issues affecting high-speed storage and fabric interconnections, during the design and validation phase as well as in the datacenter. 5G Channel Sounding Reference Solution11 August 2015 – Keysight Technologies affirmed its technology leadership in 5G wireless research with the introduction of the 5G channel sounding Reference Solution. The new Reference Solution is designed for accelerating advanced research of millimeter-wave 5G channel models and includes ultra-broadband and MIMO, key requirements to measure the millimeter-wave channel and validate new air interface standards. More Articles ...
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