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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsWireless Test Set supports new WLAN 802.11ah and 802.11af24 July 2015 – Keysight Technologies announced new WLAN 802.11ah and 802.11af capabilities for the EXM wireless test set. The EXM now supports more Internet-of-Things (IoT) wireless devices and formats in the design validation and manufacturing stages of product development. In addition, the technologies expand the test set’s existing broad multi-format coverage of wireless connectivity, cellular formats and development. CETECOM increased EMC Test Capacities for Large Objects23 July 2015 – CETECOM has upgraded its electromagnetic compatibility (EMC) test capacities to accommodate the growing customer demand for handling large objects. At CETECOM’s Saarbruecken facility, the expanded test chamber now allow large electrical cabinets, medical instruments and other large-volume objects to be accurately and efficiently evaluated. The integrated rotating platform with a high-capacity 63 A electrical motor accommodates heavy test objects with a mass up to 6 tons. Devices up to 4 meters wide can now be tested in this spacious new chamber. Handling System for Ceramic Substrate Boards22 July 2015 - IPTE expanded its EasyLine board handler portfolio with new S-size modules for hybrid products. Following modules are available: Single and Dual Lane Conveyer, Portal-unit and several traversers, Turning, Magazine-handler (loader and unloader) and magazine-buffer for up to eight magazines, Sorting-modules for defective and for recirculation fixed ceramic substrate carriers, Manual (optical) inspection, Conveyor for ionic cleaning, Special oven-emergency-buffers for magazines allowing the emptying of the oven in case of a malfunction at that part of the production line. Linking Inspection Data of AOI, SPI, and AXI Systems21 July 2015 - GOEPEL electronics launched PILOT Connect – a system for linking all test data of automatic optical, solder paste and X-ray inspection. The uniform interface centrally creates and administers the machine and operating data of the connected systems and collects all the test data in one verification and repair space. This allows a secure assessment of the errors, optimises the production process and reduces production costs. Detect and analyze Interference and hidden Transmitters that use Frequency Hopping20 July 2015 – Narda Safety Test Solutions expanded the features of its Interference and Direction Analyzer: Spectrograms with a time resolution of as fine as 1 μs now allow insights into signal structures that were otherwise only possible with large scale lab equipment. This means that interference and hidden transmitters with rapidly changing frequencies can also be analyzed and then localized with subsequent operating steps. Impedance Analyzer speeds Low-Frequency Impedance Testing17 July 2015 – Keysight introduced an enhanced measurement speed option for its E4990A impedance analyzer. With the new option, the low-frequency models of the E4990A are now as fast as the flagship 120-MHz E4990A model. Keysight’s E4990A impedance analyzer is designed for R&D, quality assurance, production and inspection engineers characterizing and evaluating passive electronic components, semiconductor devices and materials. Corelis releases new Version of Boundary-Scan Tool Suite16 July 2015 - Corelis announced the availability of version 8.2 of its ScanExpress Boundary-Scan Tool Suite. This new version adds powerful trace imaging using ODB++ netlist data to the ScanExpress Viewer circuit board diagnostic display system. Also included are test and programming support for e.MMC components, a memory model search interface, new CPU family support, plus numerous improvements spanning the complete suite of ScanExpress applications. More Articles ...
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