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Latest Test and Measurement NewsAnalysis Software for USB Protocol Analyzers16 May 2013 – Agilent Technologies announced a new analysis software suite for the U4611A, U4611B and U4612A family of USB protocol analyzers. The suite features the new MegaZoom technology, offering USB device designers quick and easy insight into their designs’ behavior, and streamlining USB test and validation. National Instruments promotes Eric Starkloff to Senior Vice President of Marketing15 May 2013 – National Instruments announced the promotion of Eric Starkloff to senior vice president of marketing. Eric leads the organizations responsible for strategic planning, positioning the company’s innovative hardware and software platforms, marketing NI’s products and corporate brand and creating an effective eBusiness platform. High-end Signal and Spectrum Analyzer for EMI Diagnostic and Precompliance Test15 May 2013 - A new measurement option for the R&S FSW signal and spectrum analyzer from Rohde & Schwarz allows developers to optimize the EMI performance of their products as early as in the design phase. This saves valuable time on the way to final EMC certification. Low Cost PXI Multiplexer Solutions14 May 2013 - Pickering Interfaces is expanding its range of low cost PXI multiplexers with the introduction of the 40-635, a single slot 3U PXI module providing a range of cost effective multiplexer (MUX) configurations for general purpose test applications. The 40-635 is available in large range of different configurations to meet many different applications. Oscilloscopes with flexible Resolution14 May 2013 - For the first time in an oscilloscope, Pico Technology has used reconfigurable ADC technology to offer a choice of resolutions from 8 to 16 bits in a single product. The PicoScope 5000 Series Flexible Resolution Oscilloscopes are available as 2-channel 60 MHz model with built-function generator and as 4‑channel 200 MHz model with built-in AWG. New eBook: Functional Tests on I2C and SPI Monitors with JTAG13 May 2013 - A new eBook from ASSET InterTech explains how the structural test methodology based on the IEEE 1149.1 boundary scan standard, known as JTAG, can apply functional tests to I2C and SPI system monitors during prototype board bring-up and later during production of the circuit board. 802.11ac WLAN One-Box Test Solution for Manufacturing13 May 2013 - Agilent Technologies announced a new wireless connectivity test set and multiport adapter to help wireless device manufacturers quickly and accurately test 802.11a/b/g/n/ac WLAN, Bluetooth 1.0 to 4.0, and Global Navigation Satellite Systems (GNSS) technologies. More Articles ...
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