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Latest Test and Measurement NewsTektronix Upgrades Arbitrary Waveform Generators22 September 2010 – Tektronix, Inc. announced the AWG7000C and AWG5000C Series of Arbitrary Waveform Generators (AWGs). The new “C” series of Tektronix AWG instruments provide a 45 percent reduction in waveform creation times compared to prior AWG instruments, essential for performance-intensive applications where large number of waveforms are required to effectively characterize high-speed serial and wideband RF/Microwave designs. Cooperation between GOEPEL electronic and IPextreme to Support IEEE 1149.7 (cJTAG)21 September 2010 - GOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant with IEEE Standard 1149.x and IPextreme, a supplier of high-quality IP (Intellectual Property) for System-on-Chip (SoC) Design, have verified new instrumentations for the recently adopted debug and test standard IEEE 1149.7 within the frame work of a long-term cooperation. Salvitech and Gardien announce Global Distribution Agreement20 September 2010 - CJ Salvitech SL, manufacturer of Flying probe testers, and Gardien Europe GmbH announced a distribution agreement for the entire Evolution Product line including the flying probe tester Evolution-2 . Agilent Technologies Expands Signal Analyzer Portfolio17 September 2010 - Agilent Technologies Inc. introduced eight new measurement applications for its PXA X-Series signal analyzer. The measurement applications cover a range of industry standards in cellular communication, wireless networking, digital video and other general purpose applications. 16-/8-Channel PXI Data Acquisition Modules16 September 2010 – ADLINK Technology announced the release of the PXI-2022/2020 high-density simultaneous sampling PXI DAQ boards. As the latest addition to ADLINK’s extensive lineup of DAQ boards, the PXI-2022 and PXI-2020 provide 16-bit simultaneous sampling of devices at sample rates of 250 kS/s per channel across sixteen and eight channels, respectively. Combination of Flying Prober and Boundary Scan Test15 September 2010 - Huntron, Inc. and JTAG Technologies announced the integration of their test methods within Huntron's range of prober enhanced analog signature analysis products. The new system combines the benefits of flying probe and boundary-scan. True-RMS clamp meter measures down to 1mA13 September 2010 - GMC-I PROSyS has introduced the CP41 AC/DC True RMS Clamp Meter, a hand-held unit that combines simplicity of operation and convenience with non-invasive measurement of current to an accuracy of ± 1% of reading and resolution of 1mA. More Articles ...
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