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Latest Test and Measurement NewsTektronix Expands Logic Analyzer Family10 September 2010 – Tektronix, Inc. announced the TLA6000 Series, a logic analyzer that brings powerful high-end debug and analysis to mainstream embedded systems designers. The TLA6000 Series delivers performance and functional capability previously only found on the high-performance TLA7000 Series of instruments at a much lower price point, while offering more capabilities than the portable TLA5000 Series models. Keithley accredited to the new ANSI/NCSL Z540.3-2006 American standard09 September 2010 - Keithley Instruments, Inc. has announced that its Metrology Services department has successfully completed a ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation). As part of the A2LA assessment, Keithley has also been successfully accredited to the new ANSI/NCSL Z540.3-2006 American standard. On-board Test Control for Debugging and Repair08 September 2010 - JTAG Technologies announces a new support package for board-level and system designers looking to implement a convenient BIT (Built-In Test) access for boundary-scan testing and on-board device (re)programming. Wafer Edge Profile, Film Edge Metrology and Edge Defect Inspection in One Tool07 September 2010 –KLA-Tencor Corporation, a supplier of process control and yield management solutions for the semiconductor and related industries, announced the latest addition to its industry-leading VisEdge family of products: the VisEdge CV300R-EP edge metrology and inspection tool. National Instruments announces NI VeriStand 201006 September 2010 – National Instruments announced NI VeriStand 2010, which includes enhancements that expand its capabilities for hardware-in-the-loop (HIL) and real-time testing by supporting high-performance, multiple chassis PXI systems and low-cost, ruggedized options using NI CompactRIO and NI Single-Board RIO hardware deployments. PXI-based Products for HD and 3D TV LVDS Applications02 September 2010 - Alfamation released two new PXI-based modules for high speed video test applications - the FlexMedia VA-01 High-Definition LVDS Video Analyzer and VG - 01 HD Video Generator. Based on the NI FlexRIO product family from National Instruments, which provides flexible, customizable I/O for NI LabVIEW FPGA, the new FlexMedia V Series modules offer a high-performance, high-throughput approach for increasingly complex video test applications. Boundary Scan tests generated faster01 September 2010 - ASSET InterTech, a supplier of open tools for embedded instrumentation, has enhanced the boundary-scan test capabilities of its ScanWorks platform for embedded instruments by adding several powerful and automated test development and debugging features that accelerate the generation of boundary-scan tests. More Articles ...
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