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Background: Testing the Stability of Printed Circuit Boards with Strain GaugesPrinted circuit boards of electronic components in automobiles, commercial vehicles, or smart phones must withstand harsh conditions in mobile use. Even slight cracks can cause the entire electronics system to fail. To prevent this, manufacturers test the mechanical stability of printed circuit boards with strain gauges.
High-Performance 14-Slot AXIe Chassis for Large Multi-Channel Test Systems10 April 2014 – Agilent Technologies introduced the new high-performance 14-slot AXIe chassis M9514A and the system module M9521A. This unique technology enables multi-module system capabilities that allow test engineers to set up large systems with all modules in a single chassis, providing better module-to-module synchronization and performance.
Inline Test Handler for Teradyne Test System10 April 2014 - ENGMATEC developed a test handler for the Inline Test Station TSi of Teradyne. The TSi test system is positioned directly below the contacting unit on a lifting unit which connects the test system by a pneumatic lift with the horizontal interface of the test adapter. Unlike competitive products, no cabling is required. Only the test adapter has short wire connections. Adapting the interface with vacuum is not required.
Interview: We offer Test Hardware and Test IP on a Subscription ModelAdvantest introduced in September 2013 a new revolutionary semiconductor test solution named CloudTesting. The new concept is targeted for silicon validation and debugging and offered only as a service. All-about-Test talked to Mr. Manabu Kimura, President and Representative Director of Cloud Testing Service, Inc. asubsidiary of Advantest, about the success of this new business model.
Finding Faults in paired metallic Cables09 April 2014 - Offering compatibility with virtually all types of paired metallic cables, comprehensive dual-channel operation, auto set up for instant use and excellent near-end fault location performance, as well as internal storage for up to 100 traces, the new TDR2000/3 time domain reflectometer from Megger is the ideal choice for rapidly, reliably and conveniently locating cable faults in telecommunications and street lighting systems.
MVG and AR Europe form EMC Systems Partnership08 April 2014 - MICROWAVE VISION Group (MVG) and AR agreed on a EMC Systems Partnership. This new agreement will allow both companies to offer quality EMC turnkey systems based upon their combined expertise and product portfolio throughout the UK, Benelux and Germany.
Conformance Test System achieves GCF Validation for LTE-A Mobile Terminal Certification08 April 2014 - Anritsu announced that the ME7873L RF Conformance Test System has become the world’s first GCF-approved mobile test system to achieve more than 80% of test cases approved for LTE-Advanced Carrier Aggregation. Conformance Test systems must obtain GCF approval for at least 80% of test cases as a condition of them being accepted for use in terminal certification by GCF. More Articles ...
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