|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement News
27 GHz PXIe Vector Signal Analyzer09 May 2014 – Agilent Technologies introduced the M9393A PXIe performance vector signal analyzer (VSA), offering speed and accuracy previously unseen in modular instrumentation, up to 27 GHz. The M9393A delivers Agilent’s proven microwave measurement technology in a PXI form-factor for manufacturing and design validation of transmitters and components for radar, military, satellite and commercial wireless communications.
First Vector Network Analyzer with 24 Test Ports09 May 2014 - Rohde & Schwarz has released the world's first network analyzer with 24 integrated test ports: the R&S ZNBT. The instrument allows users to characterize devices under test with multiple test ports and enables production lines to maintain high throughput by measuring multiple DUTs in parallel. The R&S ZNBT also offers the high RF performance of a two-port network analyzer at each of its test ports.
RF Parametric Test of FDD and TDD LTE/LTE-A Macro Base Stations08 May 2014 - Aeroflex announced the separate availability of the LTE Downlink Measurement Suite, a suite of software tools that works with the Aeroflex PXI 3000 platform to characterize the transmitter and receiver parameters of LTE base stations (eNodeB) and small cells in production test. The LTE Downlink (FDD and TDD) Measurement Suite can be used either with the recently-announced Aeroflex One-Box Base Station RF Tester, which is based on the Aeroflex PXI 3000 platform, or as an expanded application on the Aeroflex PXI 3000 Series VSA and VSG modules.
Development Environment supports BlackFin and SHARC from Analog Devices08 May 2014 - The new version of TESSY, a tool for automated unit / module / integration testing of embedded software from Hitex Development Tools, now supports CrossCore Embedded Studio (CCES) from Analog Devices for the processor families BlackFin and SHARC. CCES is a new Eclipse-based integrated development environment, which is supported by TESSY already since CCES V1.0.2.
Real time Spectrum-Analysis-Software with unlimited Screen Resolution07 May 2014 - Aaronia introduced the latest generation of real-time spectrum analysis software “MCS”. The version 1.9.0. supports unlimited screen resolution, a view in Ultra HD (4k) or even 8k (4x Ultra HD respectively 16x Full HD) is thus made possible. An other advantage of the MCS is multi-platform compatibility. MCS runs on Windows (XP, Win 7, Win 8 etc.) as well as on Linux and MAC OS, and thus includes all major operating systems.
Embedded Test of differential Clock Signals07 May 2014 – GOEPEL electronic announced the extension of the ChipVORX embedded test instruments for universal frequency measurement based on special FPGA soft macros. The ChipVORX models are modular IP to control chip embedded instruments which now allow FPGA-assisted test of differential clock signals and the measurement of frequencies directly inside the system application. This allows the user to verify the dynamics of the signals and to increase test coverage, where the workflow is fully automated by the software.
Conformance Test for IMS Emergency Services Calls06 May 2014 - Mobile device and handset manufacturers can soon certify that their products conform to the 3GPP protocols for ‘emergency services calls over IMS’ with the introduction by Anritsu of the first PTCRB-approved test case. Anritsu has added the new protocol test cases for IMS (IP Multimedia Sub-system) emergency services calls to the suite of test cases supported on the widely used ME7834L Protocol Conformance Test (PCT) system. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |