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Latest Test and Measurement News
One-Box LTE-A Base Station Tester07 February 2014 - Aeroflex launched an extended version of its TM500 industry-standard base station tester capable of emulating several thousand LTE user equipments (UE), fading channel models, and LTE-A carrier aggregation functionality in a one-box benchtop unit. The TM500 Test Mobile delivers more leading edge LTE-A development capability with a higher UE density than any other solution on the market.
Viscom reinforces Customer Support06 February 2014 – Since January 2014, Lars Bartels has reinforced Viscom’s sales customer support in Europe. With Bartels, Viscom has added an expert in AOI and X-ray inspection to its sales team. From 2004 to 2013, he carried out product and project management tasks and worked in sales for two international manufacturers of inspection systems. For three years before that, he worked for a leading X-ray inspection system manufacturer.
BER Test Solutions for Faster Design Verification06 February 2014 – Agilent Technologies introduced the new M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterization, validation and compliance testing for receivers used in multigigabit digital designs. With support for a wide range of data rates and standards, the new M8000 Series BER test solution provides insight into the performance margins of high-speed digital devices for computer, consumer, server, mobile computing and data-center products.
Multicore Debugging even with deeply embedded Systems05 February 2014 - PLS Programmierbare Logik & Systeme is exhibiting the Universal Debug Engine (UDE) 4.2 at its Booth 4 310 in Hall 4 at embedded world 2014, February 25 27, 2014 in Nuremberg, Germany. The UDE 4.2 features greatly enhanced control and test methods for multicore targets, optimized visualization options during system level testing as well as the dedicated support for a wide range of the very latest 32-bit multicore SoCs from various manufacturers.
GOEPEL electronic doubles Inspection Speed of AOI System05 February 2014 - GOEPEL electronic increased the inspection speed of its high-end AOI system OptiCon TurboLine. Innovative solutions for optimizing image capturing technology and test program execution enable an inspection time reduction of up to 50% for heavy utilization of angled-view inspection. This significant performance increase is already implemented in customer systems, proven for assembly inspection in the production process.
Microwave Analog Signal Generators with leading Phase Noise, Power and Speed04 February 2013 – Agilent Technologies expanded its range of signal generators with two new models that provide unmatched performance in phase noise, output power and frequency-switching speed. Complementing Agilent’s flagship E8267D vector PSG and E8257D analog PSG, the new N5183B MXG and N5173B EXG microwave analog signal generators provide important alternatives in size, speed and cost.
Advantest launches low-cost Terahertz Spectroscopy System04 February 2014 - Advantest launched its new low-cost, multi-purpose terahertz spectroscopy system, the TAS7400 Series. Based on Advantest’s flagship terahertz product, the TAS7500 high-end terahertz spectroscopic system, the TAS7400 utilizes terahertz waves to deliver non-destructive spectroscopic analysis within a desktop form factor. It offers comparable measurement accuracy to the TAS7500 at a lower price range. More Articles ...
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