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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsBackground: Optimize Spectrum Analyzer Settings to improve Sensitivity29 January 2014 - In many cases, the primary use of a spectrum analyzer is to measure very low-level signals. This may possibly be known signals that need to be characterized or unknown signals to be discovered. In either case, an understanding of how best to improve the sensitivity of a spectrum analyzer can aid this process. In this article we will discuss the optimum settings for measuring low-level signals. We will also discuss how to use noise corrections and noise floor extensions to maximize the instrument’s sensitivity.
World’s First 40 GHz Handheld Cable and Antenna Analyzer29 January 2014 – Anritsu Company introduces the Microwave Site Master S820E, the world’s first handheld cable and antenna analyzer with frequency coverage up to 40 GHz. In addition to providing the widest frequency coverage of 1 MHz to 40 GHz, the Site Master S820E offers field technicians, engineers and wireless network installers industry-leading dynamic range, directivity, and durability so they can conduct highly accurate measurements during the installation, maintenance, and troubleshooting of microwave communications systems. Additionally, Anritsu announces the Site Master S820E will feature Vector Network Analyzer (VNA) measurement functionality.
New medium Voltage, high Current Power Supplies28 January 2014 - HiTek Power has launched its first range of high quality, high performance, medium voltage, high current power supplies suitable for a wide variety of applications, including component testing, heaters, magnets, battery management, ion implantation and automated test. The Series MV2000 offers output voltages ranging from 20V to 300V with a maximum output power of 2kW in a compact 1U 19” rack-mountable chassis.
Labsphere expands Light Measurement Software Compatibility28 January 2014 - Labsphere’s Integral Light Measurement Software collects, analyzes and accesses data from Labsphere systems and hardware as well as components from other manufacturers used for solid state light testing. The next generation, Integral 1.2, now supports a wider range of instruments common in photometry laboratories, including Instrument Systems’ CAS 140 spectrometer.
CyberOptics to acquire 3D Metrology Company27 January 2013 - CyberOptics announced it has entered into a definitive agreement to acquire the assets of Laser Design, Inc. (LDI), a 3D metrology company headquartered in Minneapolis. The approximately $3.0 million all-cash transaction is expected to close in February 2014, pending approval by LDI’s shareholders. LDI, which will be operated initially as a wholly-owned subsidiary, is forecasted to have a minimal impact on CyberOptics’ consolidated bottom line performance in 2014. JDSU enhances Base Station Analyzer27 January 2013 - The CellAdvisor JD780A Base Station Analyzer Series of JDSU now supports LTE-Advanced, analyzing up to five component carriers and MIMO with two or four transmitting branches. Also new is PIM detection, and users can now control the instrument wirelessly up to 328 ft (100 m) via Bluetooth. These advanced capabilities let users keep pace as LTE evolves, and allow the safe testing of high-mounted remote radio units from the ground. Tektronix delivers expanded MIPI M-PHY Receiver Test Solution24 January 2014 – Tektronix announced expanded capabilities for its M-PHY Receiver test solution. The additional capabilities include physical layer receiver testing for High Speed Gear2 and Gear3, support for PWM Mode (G0-G7), auto-calibration and margin testing. Support for HS Gear2 and Gear3 and PWM Mode (G0-G7) gives designers the flexibility to perform tests at the full range of data rates for comprehensive insights into their designs. More Articles ...
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