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Latest Test and Measurement NewsGNSS Simulator supports also Chinese BeiDou Standard24 January 2013 — Rohde & Schwarz extends the functionality of the R&S SMBV100A vector signal generator by adding BeiDou/Compass capability to its integrated GNSS (Global Navigation Satellite System) simulator. With the R&S SMBV-K107 option the GNSS simulator now covers the BeiDou standard as well as the GPS, Galileo and Glonass satellite navigation systems. Fast Design-to-Automated Inspection Data Flow23 January 2013 - CyberOptics announces the close-to-immediate setup of PCBA inspection using Automated Optical Inspection (AOI) and Solder Paste Inspection (SPI) systems for new products in just one simple step. Programming automated inspection systems has been a long-standing bottleneck for the acceleration of the new product introduction (NPI) process; a barrier now removed using the Mentor Valor Process Preparation programing tool in conjunction with CyberOptics inspection systems. Nordson DAGE launches Wafer X-ray Metrology Platform23 January 2014 - Nordson DAGE announces the launch of its XM8000 Wafer X-ray Metrology Platform at the SEMI European 3D TSV Summit taking place in Grenoble, France 20-22 January 2014. This new platform takes the capabilities from Nordson DAGE’s existing X-ray systems to provide an automated, high-throughput X-ray metrology and defect review system for both optically hidden and visible features of TSVs, 2.5D and 3D IC packages, MEMS and wafer bumps. Development, Test and Debug Environment for Freescale and STMicroelectronics Microcontrollers22 January 2014 – The Universal Emulation Configurator (UEC) from PLS Programmierbare Logik & Systeme is now also available for the emulation devices MPC57xx from Freescale and SPC57x from STMicroelectronics. With the help of this special tool for definition of trace and measurement tasks for on-chip emulation logic, the full potential of the emulation devices can be used for the first time without any limitations for troubleshooting and software quality assurance. Tektronix acquires Picosecond Pulse Labs21 January 2014 - Tektronix announced the acquisition of Picosecond Pulse Labs. The move is intended to strengthen the Tektronix portfolio in the growing market for test equipment to support 100G/400G optical data communications research and development. The terms of the transaction were not disclosed. World's first Signal and Spectrum Analyzer with 500 MHz Analysis Bandwidth21 January 2014 - Rohde & Schwarz has once again expanded the analysis bandwidth for its R&S FSW high-end signal and spectrum analyzers. In the past, 320 MHz was considered an excellent value. Rohde & Schwarz is the first company to offer analysis bandwidth of 500 MHz. The new R&S FSW-B500 hardware option is now available for all analyzers of the R&S FSW family and can therefore be used for measurements in a frequency range up to 67 GHz. 64-Channel General Purpose Module for Testing of Power Management ICs20 January 2014 - Advantest Corporation introduced a new 64-channel, general purpose voltage-current (VI) module for its production-proven T2000 test platform, offering the industry’s lowest cost of test for parametric testing of high-pin-count ICs used in power-management and automotive applications. More Articles ...
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