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Latest Test and Measurement NewsAudio Precision presents Loudspeaker Test Suite18 December 2013 - Audio Precision announced a new Loudspeaker Production Test suite for loudspeaker driver production test and final QA for integrated products such as soundbars, pro-audio powered speakers, smartphones and handsfree devices. In less than one second, the Loudspeaker Production Test measurement returns multiple results: rub and buzz, impedance magnitude and phase, key Thiele-Small parameters, SPL, frequency response, phase, and distortion (either total or specific harmonics). Modular THT AOI System with double Power18 December 2013 - GOEPEL electronic enhanced its AOI system OptiCon THT-Line. Now up to two different and independently working AOI modules can be integrated in one system enclosure. One module is used for THT component inspection executed typically in the upper accumulating transport within the wave solder process. The independently working second AOI module for THT solder joints and wave-soldered SMD components can be applied either in the lower accumulating return transport or in the upper transport system. Test Handler Solution for 3+2 Axis MEMS Magnetic Sensors17 December 2013 - Multitest shipped the first MEMS tri-temp test handler solution for 3-axis magnetometer plus 2-axis low g-test and calibration. The modular concept for sensor test equipment ensures the most economic equipment utilization. The system has been designed for the industrial and automotive market segments. Both require the highest accuracy and precision as well as the full temperature scope of ambient-hot-cold. Tektronix extends Mid-Range Oscilloscope Portfolio17 December 2013 – Tektronix introduced the MSO/DPO5000B mid-range oscilloscope Series offering bandwidth up to 2 GHz with 10 GS/s sample rate and 50M standard record length. This best-in-class acquisition performance together with advanced analysis capabilities give designers the comprehensive test capabilities they need for today’s faster and more complex embedded systems at an affordable mid-level price point. VJ Electronix introduces Benchtop X-ray System16 December 2013 — VJ Electronix debuts a new low-cost, easy-to-use X-ray inspection system – the X-Quik. The X-Quik is a small, general-purpose X-ray system for inspection of items such as electro-mechanical devices, sensors, molded parts, mail parcels and biological samples. With a size of just more than two feet cubed and a low, affordable price point, the X-Quik is well suited for engineering labs, machine shops and quality control departments for a wide variety of applications. New NI VeriStand 2013 integrates with NI DIAdem16 December 2013 – National Instruments announced NI VeriStand 2013, the latest version of its configuration-based software environment with an open, intuitive interface for developing real-time testing applications. NI VeriStand software provides a common test framework capable of spanning the entire embedded software development process with test component reuse for consistency across each phase. The 2013 release features direct integration with NI DIAdem data management software, providing automated postprocessing and report generation. Network Analyzer Option for high precision S-Parameter Measurements13 December2013 – Agilent introduced a metrology option for its PNA family of network analyzers that offers national metrology institutes and calibration laboratories around the world the ultimate in S-parameter measurement accuracy. Stability and measurement accuracy are key characteristics metrology laboratories look for in a network analyzer. Most solution providers, however, fail to characterize the thermal stability of their instruments. More Articles ...
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