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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsFirst Fully Integrated PCI Express 3.0 Receiver Test Software30 August 2012 – Agilent Technologies announced the industry’s first fully integrated PCI Express (PCIe) 3.0 receiver test calibration and transmitter test software. The software provides an integrated environment for calibrating the stressed voltage and stressed receiver eye using an Agilent J-BERT bit error-ratio tester, an Agilent 90000A-, Q- or X-Series oscilloscope, an Agilent pulse function generator and Agilent PCI Express 3.0 calibration test channels. New Logic Analyzer Family offers comprehensive Suite of Tools29 August 2012 - Tektronix introduced the TLA6400 Series of portable logic analyzers that combine high performance and affordability making it ideal for a wide range of embedded system debug and validation applications. The TLA6400 Series is available in 34, 68, 102, and 136 channel configurations and comes with 25 GS/s high-speed timing resolution. NVM Express Device Controller Emulator29 August 2012 - Teledyne LeCroy Corporation introduced a new NVM Express (NVMe) Device Controller Emulator. NVMe is a storage focused protocol based on the highly adopted and efficient PCI Express protocol. NVMe-based solid state disks (SSDs) require a driver to allow them to be recognized by the operating system as a storage device. The Teledyne LeCroy NVMe Device Controller Emulator is recognized by the operating system and can emulate a storage device. 3-Phase Burst Pulse CDN for EFT Testing28 August 2012 - Teseq offers a 200 A 3-phase burst pulse coupling/decoupling network (CDN) for electrical fast transient (EFT) and burst testing. The new CDN 3083-B200 easily handles high inrush currents and pulse-shaped peak currents, making it ideal for testing high current and high power equipment in large machines, appliances and smart grid applications. GOEPEL electronic opens SCANFLEX Platform for Third Party Applications28 August 2012 - In cooperation with selected partners of the GATE alliance program, GOEPEL electronic has developed a comprehensive Application Programming Interface (API) for the company’s hardware platform SCANFLEX. The API provides third-parties direct access to, and control of, the entire SCANFLEX hardware down to bit level from their respective software systems. TRI implements Advanced Process Control System with Panasonic NPM Platform27 August 2012 – TRI has announced the successful implementation of an Advanced Process Control (APC) system between the company’s /TR7007 SII single and dual-lane solder paste inspection (SPI) systems and Panasonic’s Next Production Modular (NPM) platform. This closed loop, feedback/feedforward system is designed to increase production quality, especially on flexible circuits with 01005 components. JTAG Technologies launches new PXIe Boundary-scan Controller27 August 2012 - JTAG Technologies announces a further extension to its line of high-performance boundary-scan IEEE Std. 1149.1 controllers. Known as the DataBlaster JT 37x7/PXIe the new unit offers support for the increasingly popular PXIe/Compact PCI-express slot format that now features in some of the latest Automatic Test Equipment based on the PXI(e) standards. The new controller was developed to satisfy the growing requirements for high-speed In-System Programming (ISP) of flash memories, serial memories and CPLDs as well as complex digital circuit testing. More Articles ...
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