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Readers Top 5 News of last 30 days
News - Board and System TestOptical Wavelength Meters for 1270-1650 nm Range15 March 2013 - The new Yokogawa AQ6150 and AQ6151 optical wavelength meters are fast, accurate and cost-effective instruments for carrying out measurements in the telecommunications wavelength range from 1270 to 1650 nm. They are the latest additions to the company's market-leading range of optical test instruments, and have many features in common with Yokogawa's highly successful AQ6370 family of optical spectrum analysers. Compliance Testing for MOST and BroadR-Reach Automotive Standards13 March 2013 - Agilent Technologies introduced compliance testing support for MOST (Media-Oriented Systems Transport) and BroadR-Reach standards used in emerging automotive applications. Agilent’s solution covers all equipment needed for physical-layer testing, including oscilloscopes, spectrum analyzers and pulse/function generators. High-speed 3D In-line X-Ray Inspection System12 March 2013 - After launching the first X3 In-line X-Ray system in November 2011, MatriX Technologies now presents its new X3L system. As of this year, besides the universal 3D inspection system X3, the X3L configuration is available with an innovative dual detector concept, combining a line-scan for transmission inspection of complete PCBs in a few seconds and a high-resolution digital flat-panel for selective 3D image capturing. Systematic Software Unit Test Case Generation11 March 2013 – The German companies iSYSTEM and Berner & Mattner integrated their software test tools. With this cooperation, iSYSTEM and Berner & Mattner respond to the demand for consistent development tools and automated test tools required especially by the automotive industry. Many companies use a “line-up of tools” in the various development stages of a so-called “embedded system”. There are no smooth transitions and automatisms between the individual stages and the respective tools. Speed up Emission Measurements by a Factor of 64,00011 March 2013 - The new TDEMI X EMI Receivers of GAUSS INSTRUMENTS allows to speed up emission measurements in the frequency range up to 40 GHz by a factor of 64,000. The new product series provides in addition to the classical EMI Receiver mode a variety of measurement and analysis functions. Using high edge FPGA technology the measurement times can be reduced by a factor of 64 000. Move towards digital Technologies necessitates Bit Error Rate Testing08 March 2013 – Advances in key technologies such as synchronous optical networking (SONET)/synchronous digital hierarchy (SDH) and Ethernet over SONET (EoS), as well as the deployment of 40 and 100 gigabit networks are expected to considerably boost the demand for bit error rate testers (BERTs) globally. The market will particularly benefit from the communication and IT industries’ increasing adoption of digital technologies such as high definition multimedia interface (HDMI) and digital audio. Production Test of LTE TDD and FM/GPS/Digital Broadcast Functions08 March 2013 - Anritsu announced new options for the MT8870A Universal Wireless Test Set, to support the latest LTE-TDD standard from 3GPP and also the TD-SCDMA standard as used in China. In addition, the FM radio, GPS and digital broadcast features used in many smartphones are now also supported by this test set. This provides the most comprehensive set of options and capability for high speed testing or smartphones, in a cost effective solution. More Articles ...
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