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Readers Top 5 News of last 30 days
News - Board and System TestAT4 wireless invests in 3G and LTE Test Equipment05 February 2013 - AT4 wireless and Anritsu have recently closed an agreement to bring Anritsu test equipment for 3G and LTE conformance and carrier testing to the AT4 network of testing laboratories. The agreement includes RF, RRM and Protocol testing equipment which will be located in Spain, USA, Taiwan and Japan. Update for free JTAG/Boundary Scan Tools04 February 2013 - JTAG Technologies offers a new release of its free JTAG Live Buzz tool. The new JTAG Live V1.6 features include an automatic chain detect that can interrogate multiple boundary-scan chains to determine the number of components in each plus their manufacturer and type. Another new feature is multi-language support. Now users from Japan, Germany, Russia, France, China, Holland and Portugal can get up and running in their native language. Coupling/Decoupling Network for Telecom Surge Testing04 February 2013 - Teseq designed a new CDN (coupling/decoupling network) for surge testing on unshielded symmetrical high speed telecommunication lines including Ethernet. The CDN HSS-2 enables convenient surge testing with 1.2/50 µs pulses on active telecom lines. Ideal for use in laboratories, Teseq’s CDN HSS-2 is compliant with IEC 61000-4-5 and is compatible with all industry standard surge generators. Arbitrary Waveform Generator Support for HDMI and MHL Sink Tests30 January 2013 – Agilent Technologies announced support for the High-Definition Multimedia Interface (HDMI) and Mobile High-Definition Link (MHL) sink tests through its M8190A arbitrary waveform generator and enhanced N5990A test-automation software. The new test solution reduces development costs while providing accurate test results with greater flexibility than other HDMI and MHL test solutions. Fast way to generate functional Test Programs29 January 2013 - Understanding the need for a fast and efficient way to generate functional test programs, Diagnosys has designed the all new Data Capture Pod. By capturing electronic signals on an IC or at an edge connector of a PCB, the Data Capture Pod quickly converts them to a functional test program ready for use with the PinPoint range of test and fault finding systems. Having user programmable threshold voltages, sampling rates and trigger conditions, the pod handles complex circuits and has dedicated analog channels for even more versatility. In-System Programming of Power Management Devices28 January 2013 - JTAG Technologies has broadened its portfolio by offering a unique Power Management Bus (PMBus) IC programming solution that supports devices from leading vendors Linear Technologies and TI. PMBusProg supplements JTAG’s existing range of SCIP (Serial Controlled IC Programmers) that are already widely used within the manufacturing processes of CEMs, and ODMs. New Market Overview: Desktop AOI Systems28 January 2013 – All-about-Test published a new market overview covering Desktop AOI Systems. We have compiled comprehensive information on this type of inspection systems used in the production of electronic products. You will find an overview of recently published news on this subject on All-about-Test and a market overview of products and providers, together with relevant web links. More Articles ...
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