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News - Board and System TestPXI Digital Audio and Video Analyzer16 January 2012 – National Instruments announced the new NI PXIe-1491 digital audio and video analyzer for HDMI, DVI and mobile devices. Designed for performance testing and high-throughput test of consumer devices such as set-top boxes, Blu-ray players, smartphones and tablets, the NI PXIe-1491 delivers automated, high-performance measurements to eliminate subjective manual inspection. Frost & Sullivan names Anritsu Global Test & Measurement Company of the Year15 January 2013 - Frost & Sullivan has presented Anritsu Corporation with its global Company of the Year Award for Test & Measurement. In selecting Anritsu, Frost & Sullivan cited the company’s strong customer relationships, ability to develop products that meet market needs, and value proposition, particularly in introducing test solutions for the LTE market. First LTE-Advanced 8x8 MIMO Signal-Generation and Analysis Solution07 January 2013 – Agilent Technologies affirmed its technology leadership in LTE-Advanced test with its introduction of the industry’s first LTE-Advanced 8x8 MIMO signal-generation and analysis solutions. The solutions comprise Signal Studio and 89600 VSA software, as well as the Agilent X-Series vector signal generators and multi-channel signal analyzer with up to eight measurement channels. The offerings complement Agilent’s other industry-first solutions for the LTE-Advanced standard. Signal Analyser and Vector Signal Generator supporting LTE-Advanced / WirelessLAN21 December 2012 - Anritsu announce the release of its range of key software suites supporting next-generation LTE-Advanced 4G mobile phone systems as well as IEEE802.11ac wireless LAN devices for the popular MS269xA/ MS2830A Signal Analyser series and MG3710A/MG3700A Vector Signal Generator series. Boundary Scan Option for TEST-OK Functional Tester18 December 2012 - Within the scope of an OEM cooperation, GOEPEL electronic and TEST-OK have developed a professional Boundary Scan option for the TEST-OK functional test system. The new integration solution is based on a specially developed plug-on module named UCM1149. The full integration of GOEPEL electronic’s Boundary Scan software and hardware in the TEST-OK test concept offers several benefits, such as higher test depth and fault coverage as well as cost reduction. Industry’s First eMMC Compliance Test Application18 December 2012 – Agilent Technologies introduced the industry’s first eMMC (embedded multimedia card) compliance test application for embedded storage solutions. The Agilent N6465A eMMC test application helps memory design engineers validate and debug eMMC NAND flash memory cards faster by automating the execution of a series of parametric tests, including electrical and timing measurements, on Agilent Infiniium 9000, 90000A, 90000 X- and 90000 Q-Series oscilloscopes. XJTAG releases v3.0 Boundary Scan Software17 December 2012 — XJTAG launched version 3.0 of its boundary scan development system. XJTAG 3.0 now works faster and more intuitively to deliver the smartest testing solution for programmers and engineers. Crucial development tools such as XJAnalyser and XJDeveloper have been upgraded to run more effectively, maximising the opportunity for high work efficiency and productivity. Version 3.0 features run-time enhancements which boost the speed of XJEase testing and device programming in XJDeveloper and XJRunner. More Articles ...
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