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Readers Top 5 News of last 30 days
News - Board and System TestHighly precise and fast Inspection of Solder and Sinter Pastes11 May 2015 - GOEPEL electronics introduced a new-generation solder paste inspection system. The SPI-Line 3D allows solder pastes and sinter pastes with a height of less than 50 µm to be measured precisely and quickly. The newly developed measuring head, with double-sided projection within the device, provides the maximum degree of repeatability and reliability through its shadow-free inspection. USB 2.0 and Power Delivery Protocol Analyzer07 May 2015 – Teledyne LeCroy continues to add support for the new USB Type-C and Power Delivery 2.0 standards with introduction of the Mercury T2C USB Power Delivery and USB 2.0 Protocol Analyzer. The Mercury T2C joins the Teledyne LeCroy USB Voyager M310C, which together provide the USB development community with extensive levels of capability for test, validation and compliance of the emerging USB standards. The USB Type-C and USB Power Delivery 2.0 standards introduce entirely new USB cables and connectors expected to significantly improve user experience. SMH Technologies introduces first PXI In-System Programmer06 May 2015 - SMH Technologies developed the new universal programmer FRPXIA3. FlashRunner FRPXIA3 based on FlashRunner technology, the extremely fast and reliable programming system for Flash-based microcontroller and serial memories is the first in the world programming solution for PXI system with fully hardware and software ATE integration and Multi-target parallel programming channels. Boundary Scan Analyzer supports Intel Microarchitecture Codenamed Skylake05 May 2015 - Keysight announced its Keysight x1149 boundary scan analyzer will expand its coverage capabilities to test the upcoming Intel microarchitecture codenamed Skylake. The Keysight x1149 analyzer is designed to maximize structural test coverage for board designs that incorporate Intel processors. This additional test application for the Intel microarchitecture codenamed Skylake will help electronics designers and manufacturers use the x1149 to test boards with the new microprocessor architecture using boundary scan and Intel Silicon View Technology (Intel SVT). Probe Family for RF Signal Testing of PCBAs05 May 2015 - Everett Charles Technologies (ECT) launched a new line of high frequency test probes for the PCBA and industrial test markets. The CSP-40 high frequency probe family offers high reliability and excellent electrical performance at competitive pricing and significantly reduces the cost per test insertion. Software optimizes automated testing using Network Analyzers04 May 2015 - The new R&S ZNrun software from Rohde & Schwarz assists users in configuring measurements specifically for multiport DUTs using Rohde & Schwarz vector network analyzers (VNA). The user selects the VNA and any additional test equipment for example an R&S ZNB vector network analyzer and an R&S ZN-Z84 switch matrix and sets the parameters to be measured on the DUT. Based on this information, the R&S ZNrun software takes over communications with the test equipment, makes all of the settings, and executes and controls the test sequence. This procedure simplifies in particular the time-consuming characterization of multiport components. Immunity Test in Frequency Range from 15 Hz to 150 kHz30 April 2015 - Teseq offers a testing system that meets the new requirements for immunity testing to low-frequency disturbances in the frequency range of 15 Hz to 150 kHz. The NSG 4060 complies with current testing standards, including EN 61326-3-1, IEC 61850-3, IEC 60255-22-7, IEC 60533/IEC 60945, IEC 61000-4-16 and IEC 61000-4-19. More Articles ...
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