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News - Board and System TestSignal Quality Analyzer for High Speed Serial Transmissions15 June 2015 – Anritsu Corporation launched new MP1861A MUX and MP1862A DEMUX modules for the MP1800A Signal Quality Analyzer. This will expand the functions of the MP1800A 32G BERT to support 56G and 64G BER measurements required for evaluating high-speed serial transmission devices, such as SERDES. When used in conjunction with the MP1800A, the two new modules support a generation of NRZ Data and BER measurements up to 64.2 Gbit/s. Free Real-Time Digital Modulation Analysis Tools10 June 2015 - Signal Hound has updated its free Spike Spectrum Analysis software by creating a variety of digital modulation analysis tools for its BB60C and BB60A USB-powered real-time spectrum analyzers. Spike software version 3.0.8 now provides constellation diagrams, symbol tables, error-vector magnitude (EVM) measurements, and bit pattern matching analysis tools for a wide range of modulation types. NVMe Analysis Features for Storage Development and Test04 June 2015 – Teledyne LeCroy released its new PCIe Protocol Suite 7.34 which adds extensive enhancements for PCIe-based storage analysis on the Summit PCI Express Protocol Analyzer product line. Protocol analyzers and exercisers are used by developers and validation engineers to directly record and examine data traffic on serial data communication links between devices and systems. This equipment enables SSD developers to reduce debug and test schedules, lower engineering development costs on new products and meet aggressive time-to-market requirements. Optical Test System with Attenuation and Switch Modules03 June 2015 - Yokogawa has expanded its AQ2200 Series Multi-Application Test System (MATS) with a range of optical attenuation and switch modules for applications involving GI50 multimode optical fibre. The modular AQ2200 Series is available with two different frame controller platforms with three or nine slots for connecting modules. New Test Strategy for IoT Devices02 June 2015 - Under the name JEDOS (JTAG Embedded Diagnostics Operating System), GOEPEL electronics introduces a new technology for embedded test of complex electronic designs. The new test strategy has been developed in particular for diagnostic testing of devices for the Internet of Things (IoT). New Technology for IoT Test and Debug18 May 2015 – Teledyne LeCroy announces ProVIDE, a new, patent pending, technology created for IoT and embedded developers. IoT devices bring multiple technologies into SoCs designs, and since these technologies are defined more and more by embedded software, there is an increasing need for effective ways to develop, test and debug software and hardware interaction. ProVIDE, Protocol View for Integrated Debug Environments combines two important test and debug methods – software IDE and Protocol Analysis. Test System covers all RX in-band Test Cases for LTE FDD 3CC Carrier Aggregation12 May 2015 - The R&S TS8980 RF (pre) conformance test system from Rohde & Schwarz now features all six receiver in-band test cases for LTE FDD carrier aggregation with three downlink component carriers (3CC). Manufacturers of mobile user equipment and chipsets as well as test houses can use this to test 3CC carrier aggregation implementation in accordance with the 3GPP TS 36.101 technical specification. More Articles ...
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