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Readers Top 5 News of last 30 days
News - Component TestTest of High-Voltage Semiconductors04 December 2018 – Advantest Corporation launched a new module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdown voltages. Pattern Conversion Software for Cloud-Based Semiconductor Testing27 November 2018 – Test Systems Strategies, Inc. (TSSI), a supplier of design-to-test pattern conversion, simulation and validation tools, and Advantest CloudTesting ServiceTM (CTS), developer of the semiconductor industry’s first on-demand testing service, announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform. Switching Current Measurement for Memory Test Systems15 November 2018 – Advantest announced that a collaboration between the company and Tohoku University’s Center for Innovative Integrated Electronic Systems (below, Tohoku University CIES) has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM), a highly-anticipated next-generation memory technology, in units of microamperes and nanoseconds, using an Advantest memory test system. Memory Burn-In Testers for Next-Generation NAND Flash Memories05 November 2018 – Advantest launched two additional members of its next-generation B6700 family of burn-in memory testers. The new B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demand for server and mobile data-storage applications. Memory Burn-In Tester for NAND Flash and DRAM Devices15 October 2018 – Advantest announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test. Highly scalable Test Platform for Display Drivers08 October 2018 - Xcerra’s highly flexible Diamondx test platform can scale up to over 5000 display driver digitizers, supporting aggressive multi-site production strategies. With a wide range of general purpose and specialized instruments, the Diamondx platform meets the current and future test requirements of display driver devices, as well as the complete spectrum of multimedia ICs. Semiconductor Test Handler with Double Device Detection and Automatic Temperature Calibration05 September 2018 - Xcerra has added two new optional features to the MT2168 XT pick-and-place handler. Both options target optimization of test floor processes, allowing the customer to deliver enhanced quality: the Double Device Detection (DDD) option increases binning integrity; the Automatic Temperature Calibration enables the customer to meet quality standards by calibrating as scheduled without time consuming manual processes. More Articles ...
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