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Readers Top 5 News of last 30 days
News - Component TestOver-the-Air (OTA) Integrated Test Solution for Antenna in Package28 May 2018 - Multitest delivered a production interface solution to a customer for OTA testing of a 60 GHz UltraGig single-chip integrated Antenna in Package (AiP). The solution integrates the xWave OTA Contactor with xWave patch antenna in the MT2168XT leadbacker. This integration of an OTA patch antenna into the leadbacker of a production pick and place handler is believed to be the first in the industry. SourceMeter Instrument with 4 Channels in 1U Slot24 May 2018 – Tektronix unveiled the Keithley Model 2606B System SourceMeter instrument that packs four 20-watt SMU channels into a single 1U form factor chassis. Targeting the fast-growing 3D sensing manufacturing industry, the rackspace-saving Model 2606B combines the capabilities of a precision power supply, true current source, 6½-digit DMM, arbitrary waveform generator, and pulse generator into one tightly integrated instrument. Pick-and-Place Handler Option for avoiding ESD Pre-Damages16 May 2018 - The Multitest MT2168 pick-and-place handler now offers a ground fault monitoring option. The ground fault monitoring option is part of a feature set that will enhance the value of the production output at the customer site. Ground fault monitoring is an important feature for meeting advanced quality standards. Floating Power Source for Testing Power-Management-ICs07 May 2, 2018 – Advantest extended the performance of its V93000 single scalable platform with the FVI16 floating power VI source for testing power and analog ICs used in automotive, industrial and consumer mobile-charging applications such as the growing e-mobility and rapid charger market. By supplying 250 watts of high-pulse power and up to 40 watts of DC power, the new source helps to provide sufficient power testing latest generation devices while conducting stable and repeatable measurements. Quick and easy Test Socket Replacement04 May 2018 - Multitest’s Quick Lock Contact Unit Holder (CUH) for ecoAMP and DuraKelvin Plunge-to-Board set-ups on the MT9928 gravity feed handler has been adopted as the standard mounting solution by one of Multitest’s largest automotive customers. Quick Lock demonstrated substantial reductions in maintenance, debugging, and repair times. High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories09 April 2018 – Advantest introduced its T5503HS2 memory tester, the industry’s most productive test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” in which global demand for memories is skyrocketing. Testing Service for CMOS Image Sensor Wafers30 March 2018 - Testing CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically for an array of large sensors or even sensors that are right up to the size of an entire 12-inch wafer. More Articles ...
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