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Readers Top 5 News of last 30 days
News - Component TestOptoelectronic Device Testing up to 110 GHz27 October 2015 – Anritsu enhances its MN4765B series of O/E modules for the MS4640B VectorStar Vector Network Analyzer (VNA) family that creates a cost-effective and flexible solution for measuring 56 Gb/s components and transceivers used in telecommunications and data communications applications. The MN4765B module, combined with the MS4640B VNA, provides a simplified approach for optoelectronic measurements and is an economical alternative to conventional total-system approaches currently used in R&D and manufacturing environments. Low-Frequency Vector Network Analyzer for Testing passive Components15 October 2015 – Keysight launched five new frequency options for its E5063A ENA Series network analyzer and set the E5063A’s new starting price at $10,000. With these new options and price, the E5063A now offers the best balance between price and performance. The new E5063A frequency options cover the 100 kHz to 500-MHz (Opt. 205), 1.5-GHz (Opt. 215), 3.0-GHz (Opt. 235), 6.5-GHz (Opt. 265) and 14-GHz (Opt. 2D5) frequency ranges. PXIe Multiport Vector Network Analyzer13 October 2015 – Keysight Technologies introduced a high performance PXIe multiport vector network analyzer, the M9485A VNA, designed for high-volume wireless component manufacturing of front-end modules, switches and filters used in mobile phones and base stations. The true multiport architecture provides best-in-class measurement speed up to 30 percent faster than competing offerings, while maintaining high dynamic range. 300 kHz LCR Meter with Sweep and Bin Sorting Functions05 October 2015 - B&K Precision introduced their new model 891 300 kHz bench LCR meter. This new compact, value-priced LCR meter can measure inductance, capacitance, and resistance with 0.05% best impedance accuracy over a fully adjustable test frequency range of 20 Hz to 300 kHz. With a 300-point linear and logarithmic sweep function, bin comparator, and versatile remote control interfaces, the 891 is suitable for characterizing components in laboratory, quality control and small volume production environments. Keithley reduces Test Times for Parametric Test System by 25 Percent28 September 2015 – Tektronix released a major system software update (KTE version 5.6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent. This translates into increased wafer-level test throughput and directly improves the S530’s cost of ownership (COO) for semiconductor production and R&D departments. Multitest launches HC Contactor for high parallel Test09 September 2015 - Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test. High Bandwidth Semiconductor Test Probes01 September 2015 - Everett Charles Technologies (ECT) launched a new member of the versatile ZIP semiconductor test probe family. The Z-080YHJ is designed to meet the many challenges associated with testing High End Digital (HED) devices. ZIP probes are a cost effective solution that provide excellent mechanical reliability and electrical performance. More Articles ...
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