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Readers Top 5 News of last 30 days
News - Component TestTeradyne offers Real-time and Offline Test Data Analysis Software16 June 2015 - Teradyne announced that it entered into an OEM agreement to provide an integrated, advanced analysis capability for Teradyne's entire line of semiconductor test equipment. Under the terms of the agreement, Teradyne will integrate special versions of Galaxy's Examinator and Examinator-Pro software as an option to its Semiconductor Test platforms. Boston Semi Equipment ships first Test Handlers from new Facility12 June 2015 - Boston Semi Equipment (BSE) announced that its semiconductor device handler business has shipped the first systems to customers from its new facility. BSE's test handler business will continue the development of the company's line of gravity feed handlers in the new location, while also expanding into other handling technologies and developing custom automation solutions for customers. Integrated Test Solution for Optical Transceivers11 June 2015 - Advantest introduced its new 28G OPM (28-gigabit Optical Port Module), the company’s first solution designed specifically for testing optical transceivers – advanced semiconductor devices that transmit and receive data through optical fibers. By using fiber optics, these devices enable data transmissions over longer distances at faster speeds and lower power consumption than wire cables. This technology is used extensively in applications such as data centers, which manage the extremely high volumes of data transmissions used in mobile communications and cloud computing. Platform for Wafer-Level Device Characterization29 May 2015 – Keysight Technologies unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components. By efficiently controlling all components in a wafer-level measurement system (instruments and wafer probers alike), WaferPro Express reduces measurement setup complexity and provides a unified platform for efficient automated measurement and data management. Semiconductor Circuit Analysis using Terahertz Technology27 May 2015 – Advantest developed a technology utilizing short-pulse terahertz waves for analysis of electrical circuits. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz to 1THz), and characterization and location of failures in chip circuits (TDT/TDR). The new technology overcomes the technical obstacles and prohibitive cost of existing technologies, and will contribute significantly to the development and wider adoption of these leading-edge devices. 4-port Broadband VNA System with Frequency Coverage from 70 kHz to 110 GHz20 May 2015 – Anritsu introduces the VectorStar ME7838A4 4-port broadband vector network analyzer (VNA) system that features the world’s widest differential broadband sweep from 70 kHz to 110/125 GHz and utilizes the smallest mmWave modules to conduct highly stable and fast measurements when characterizing differential devices. The new ME7838A4 allows to conduct differential measurements with great confidence in next-generation communications system designs. Teradyne launched new ETS-800 Test System19 May 2015 - Teradyne announced the availability of the ETS-800 test system designed to further drive down the cost of test in the linear, power and automotive markets. The system introduction coincides with the availability of a suite of instruments to address the requirements of the analog test market. System shipments began in the third quarter of 2014 and are in production at multiple customers. The platform delivers high test cell throughput for complex analog devices through a combination of unique ETS-800 capabilities. More Articles ...
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