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News - Component Test
Advantest opens Registration for VOICE 2015 Developer Conference14 January 2015 – Advantest Corporation will hold its annual VOICE developer conference on May 12-13 at the Hyatt Regency Santa Clara in Silicon Valley, California and May 22 at the Radisson Blu Pudong Century Park in Shanghai, China. VOICE 2015 will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.
PXI-based Semiconductor Tester13 January 2015 – Marvin Test Solutions announced the TS-960, the newest version of its successful TS-900 semiconductor test platform. The TS-960 brings the performance and features of high-end systems to customers at a fraction of the footprint and with outstanding value compared to traditional ATE.
Advantest extends T2000 Platform with Parametric Measurement Module17 December 2014 – Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analog and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accuracy.
Handler for testing advanced Memory ICs11 December 2014 - Advantest Corporation introduced its new M6245 test handler, offering industry-leading productivity with minimal downtime by incorporating the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The M6245 handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.
Testing Solutions for more than 300 Wireless and Cellular Chipsets02 December 2014 – LitePoint announced that its innovative wireless test solutions now support over 300 wireless connectivity and cellular chipsets. LitePoint’s IQfact+ solution library covers the most commonly used wireless standards including 802.11ac/a/b/g/n/j/p, Bluetooth LE and Classic, GPS, GLONASS, COMPASS, ZigBee, DECT, DAB, FM, and Near Field Communications (NFC).
USB 2.0 Connector and Cable Assembly Compliance testing using a Network Analyzer24 November 2014 – Keysight Technologiesannounced the availability of its Method of Implementation (MOI) document for USB 2.0 connector and cable assembly compliance testing using the ENA Series network analyzer’s enhanced time domain analysis option (E5071C-TDR).
Package Characterization at Cold Conditions21 November 2014 - The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving requirements for temperature performance driven by applications in the end markets. Whereas final test of the respective devices in high volume production will only be done at ambient/hot, they need to get qualified for cold conditions before they ramp. More Articles ...
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