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Readers Top 5 News of last 30 days
News - Component Test
Full Two-Port 26.5 GHz Vector Network Analyzers fit in just one PXI Slot03 October 2014 – Keysight Technologies announced a series of one-slot PXI vector network analyzers that cover 300 kHz up to 26.5 GHz. The new analyzers offer the best PXI VNA performance on key specifications such as speed, trace noise, stability and dynamic range. This enables the PXI VNAs to perform fast, accurate measurements and reduce the cost-of-test by enabling simultaneous characterization of many devices – two-port or multi-port – using a single PXI chassis.
Advantest launches System for Semiconductor Packaging Inspection03 October 2014 – Advantest announced a new mold thickness metrology system, the TS9000, for measuring the thickness of semiconductor packaging. The system is based on advances in Terahertz (THz) technology pioneered by Advantest. The TS9000 Mold Thickness Analysis (MTA) System is a new metrology tool that performs non-destructive analysis of the thickness of semiconductor packaging.
Cost-efficient Vector Network Analyzer for uni- and bidirectional Measurements01 October 2014 - The new R&S ZND vector network analyzer from Rohde & Schwarz features two test ports, and the base unit is designed for unidirectional measurements from 100 kHz to 4.5 GHz. Its easy-to-use options provide for flexible upgrades. The frequency range can be extended to 8.5 GHz, plus the instrument can be equipped for bidirectional measurements up to 4.5 GHz or 8.5 GHz. These functions can be locally activated.
aps Solutions enters into a distribution and service agreement with BE Precision Technology26 September 2014 - aps Solutions GmbH announces the signing of an agreement with BE Precision Technology, a manufacturer of Probe Card Analyzers for the Semiconductor probe card market.
PXI-based Semiconductor Test System22 September 2014 – National Instruments announced the NI Semiconductor Test System (STS) series. These PXI-based automated test systems reduce test cost for RF and mixed-signal devices by opening access to NI- and industry-offered PXI modules in semiconductor production test environments. Compared to conventional semiconductor automated test equipment (ATE), STS lead users are experiencing reduced production costs and increased throughput and can now perform both characterization and production with the same hardware and software tools.
High Volume Test Solution for Magnetic Sensors12 September 2014 - Multitest’s sensor calibration and test equipment for magnetic sensors using Helmholtz coils provide a highly integrated and compact solution for volume test. The setup ideally combines the advantages of Multitest’s modular concept for sensor test equipment with the benefits of a compact and robust design. This way low investment cost and highest ease-of-use on the test floor are ensured.
Femto/Picoammeters and Electrometers for Materials Research10 September 2014 – Keysight Technologies introduced the B2980A Series of femto/picoammeters and electrometers, the world’s first graphical picoammeters and electrometers to confidently measure down to 0.01 fA which is 0.01 x 10E-15 A, and up to 10 petaohms (PΩ) which is 10 x 10E15 ohms. Since AC power line noise can be difficult to eliminate when making low-level measurements, both instruements are available in battery powered versions. All B2980A series products have a 4.3” liquid crystal display that supports a variety of viewing modes (numeric, trend chart and histogram), which eliminates the need to perform data analysis on a PC. More Articles ...
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