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News - Component Test
Flexible SSD Test Solution enables Rapid SSD Development and Production Ramp-up27 June 2014 – Advantest introduced the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs) by launching its flexible MPT3000 system, which enables accelerated SSD product development and faster time-to-manufacturing ramp. The system improves users’ engineering efficiency through powerful, easy to use software tools and a revolutionary multi-protocol hardware architecture.
Reticle Inspection System for 20nm Design Nodes and beyond20 June 2014 -- KLA-Tencor Corporation announced the Teron SL650, a new reticle quality control solution for IC fabs that supports 20nm design nodes and beyond. With 193nm illumination and multiple STARlight optical technologies, the Teron SL650 provides the sensitivity and flexibility required to assess incoming reticle quality, monitor reticle degradation and detect yield-critical reticle defects, such as haze growth or contamination in patterned and open areas.
Agilent and Cascade Microtech cooperate on Wafer-Level Measurements12 June 2014 – Agilent Technologies and Cascade Microtech announced a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.
Improved Power Delivery for High Performance Load Boards10 June 2014 - Multitest improved the electrical performance of load boards used for device test by applying capacitor implants and embedded capacitor cores. Capacitor implants allow for placing the single capacitors close to the device under test (DUT), whereas the capacitance core is placed as a layer between the power and ground layer. Both methods can decrease loop inductance in the power delivery network and support ambient-hot-cold applications from -55°C to +120°C.
Advantest entered again 10 BEST List of IC Test Equipment Supplier09 June 2014 - Advantest Corporation has been named to VLSIresearch’s 10 BEST list for the 26th consecutive year. The ratings are based on direct customer feedback representing 95 percent of the world’s chip producers - Integrated Device Manufacturers (IDMs), Fabless and Outsourced Assembly and Test (OSAT) companies.
2- and 4-Port Vector Network Analyzers for testing passive Devices06 June 2014 – Anritsu introduced the ShockLine family of Vector Network Analyzers (VNAs), which combine high accuracy, sensitivity and sweep speed with prices as much as 75% lower than those of traditional bench-top VNAs. The new instruments are intended for the testing of passive devices such as cables, connectors, filters, and antennas in a wide variety of engineering, manufacturing and education applications.
Advantest introduces Measurement System for Testing Analog, Mixed-Signal and Sensor ICs30 May 2014 - Advantest Corporation released its new EVA100 measurement system, a value-added platform that combines digital and analog testing capabilities to handle small-pin-count analog, mixed-signal and sensor semiconductors. The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions. Operation is highly intuitive, alleviating the need for users to have advanced programming skills and helping customers to get their latest ICs to market faster. More Articles ...
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