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Readers Top 5 News of last 30 days
News - Component TestTouchscreen Source Measure Unit Instrument offer 7 Ampere DC and Pulse Current10 November 2014 – Keithley Instruments announced the Model 2460 SourceMeter Source Measure Unit (SMU) Instrument, the company’s latest benchtop SMU instrument with a capacitive touchscreen graphical user interface (GUI). The Model 2460 offers users higher power sourcing (up to 105V, 7A DC/7A pulse, 100W max.) with 0.012% basic measurement accuracy and 6½-digit resolution, making it ideal for high power, high precision I-V characterization of modern materials and high power devices.
High Voltage Capacitance-Voltage Test on Wafer-Level31 October 2014 – Keithley Instruments introduced new enhancements to its Parametric Curve Tracer (PTC) configurations that incorporate high power SourceMeter Source Measure Unit (SMU) instruments. For test engineers responsible for configuring high power semiconductor test systems, the new Keithley Model 8020 High Power Interface Panel improves connectivity and simplifies complex measurements like high voltage capacitance-voltage (C-V) measurements.
Tester for Display Driver Semiconductors used in High-Resolution LCD Panels28 October 2014 – Advantest has launched its new T6391 system for testing next-generation display driver ICs (DDIs) and their embedded functions that control high-resolution LCD panels. The new tester is designed to address three key trends in the next-generation DDI market – the growing number of pins on display driver devices, the increasing speeds of interfaces and highly integrated multi-functions – all of which contribute to higher resolution displays.
Characterization of active Components up to 67 GHz23 October 2014 - Characterizing active components such as amplifiers or combined transmit/receive (T/R) modules places high demands on the RF performance and flexibility of the test equipment used. The new R&S ZVAX-TRM extension unit from Rohde & Schwarz now enhances the test set of an R&S ZVA network analyzer to cover these complex measurements for applications up to 67 GHz. The R&S ZVAX-TRM conditions the stimulus and measured signals as required for a given task, enabling measurements at high power levels as well as pulsed signal or group delay measurements.
Advantest Opens VOICE 2015 Call for Papers17 October 2014 – Advantest has issued a VOICE 2015 international call for papers focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices and handler solutions. VOICE, the annual Advantest Developer Conference, will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions.
Versatile RF Probes for Semiconductor Test13 October 2014 - Everett Charles Technologies (ECT) launches two new members of the ZIP probe family designed to meet signal integrity challenges driven by the ever increasing speed of semiconductors devices. Z0 and Z1 probes are a cost effective solution that provide excellent mechanical reliability and electrical performance.
Boston Semi Equipment creates independent ATE Organization06 October 2014 Boston Semi Equipment (BSE) has combined all of its automated test equipment (ATE) businesses under the Boston Semi Equipment brand name. Effective immediately, the Test Advantage Hardware and MVTS Technologies businesses will operate using the Boston Semi Equipment name. This follows the company's announcement in July that it was integrating all sales and service for ATE, Prober and Test Handler products into the Boston Semi Equipment field sales organization. More Articles ...
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