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Readers Top 5 News of last 30 days
News - Component TestTest Handler Solution for 3+2 Axis MEMS Magnetic Sensors17 December 2013 - Multitest shipped the first MEMS tri-temp test handler solution for 3-axis magnetometer plus 2-axis low g-test and calibration. The modular concept for sensor test equipment ensures the most economic equipment utilization. The system has been designed for the industrial and automotive market segments. Both require the highest accuracy and precision as well as the full temperature scope of ambient-hot-cold. High-Performance Test Handler for SoC Devices12 December 2013 - Advantest launched its newest test handler for system-on-chip (SoC) devices, the field-upgradable M4871 pick-and-place system. The handler integrates Advantest’s proven technology from the company’s existing product lines with advanced, new functions including visual alignment with high throughput, active thermal control using Advantest’s Tri-Temp capability and a new handler data visualization framework that enables users to conduct real-time monitoring of a test cell’s production status from any network-enabled connection. New Wiring Validation Software makes testing faster, easier04 December 2013 – CableTest Systems announced the launch of its newest software product, ‘MPT Studio’, a powerful user and programmer environment for its market leading ‘MPT’ line of multi-function electrical wiring analyzers. MPT Studio makes it easier for first time users of automated test equipment to perform complex testing of cables, connectors, and wiring systems with menu-based test programming, new high speed test functions and visual aids for product troubleshooting. Innovative Wafer Inspection combining 2D and 3D Measurements02 December 2013 - Since the density and complexity of wafer structures increase every year, the industry needs high-performing and reliable systems for quality control. Against this background, ISRA VISION introduces a product line offering an innovative technological approach for non-contact optical wafer inspection. As required, different 2D and 3D gauging procedures may be combined into one inspection system measuring structure sizes of down to 1 micrometer in under one minute. Advantest launches Photo Mask Measurement Tool27 November 2013 - Advantest Corporation launched its new E3640 MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) tool for measurement of patterns on photomasks and other media ad dimensions as small as 1Xnm. A new entry in Advantest’s widely-adopted E3600 Series of SEM systems, the E3640 delivers significantly improved measurement accuracy and higher throughput. Its industry-best pattern measurement capability supports the coming shift to the 1Xnm node for semiconductor volume production. Cascade Microtech acquires ATT Advanced Temperature Test Systems GmbH08 November 2013 - Cascade Microtech acquired ATT Advanced Temperature Test Systems GmbH ("ATT Systems"), which is headquartered in Munich Germany. ATT Systems is manufacturing advanced thermal systems used in the testing of semiconductor wafers. ATT Systems provides enhanced thermal solutions for wafer testing over expanded temperatures that typically range from -60 to 300 degrees centigrade. Cascade Microtech believes the acquisition strategically positions the combined companies for future system development and access to larger markets. ATT Systems' management team will remain with the company in Munich. LitePoint acquires ZTEC Instruments04 November 2013 – LitePoint, a provider of wireless test solutions, completed the acquisition of privately-held ZTEC Instruments, a manufacturer of innovative modular wireless test products, located in Albuquerque, New Mexico and Orlando, Florida. LitePoint, a wholly owned subsidiary of Teradyne, is based in Sunnyvale, California. More Articles ...
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